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T&MW's Best in Test 2012: Award Winners

T&MW Staff- February 7, 2012

On January 31, 2012, during a ceremony held in conjunction with DesignCon 2012, the editors of Test & Measurement World announced the winners of the annual Best in Test, Test Product of the Year, Test of Time, and Test Engineer of the Year awards. We announced the finalists in November, and the winners were chosen by the votes of our readers and editors.

Click the links below to read about the winners and see photos of the award recipients:

• Best in Test: ATE/Production Test, Bus Analyzers, Data Acquisition, Design for Test/Boundary Scan

• Best in Test: Embedded Test, Functional Test, LTE Test, Machine Vision/Inspection
  
• Best in Test: Multimeters, Optical and Network Test, Oscilloscopes, PHY Test
  
• Best in Test: RF/Microwave Test, Semiconductor Test, Signal Analyzers, Signal Sources, Source-Measure Instruments
  
• Test Product of the Year, Test of Time, Test Engineer of the Year
  

At the end of the 2012 awards ceremony, all of the winners gathered with Martin Rowe (left) and Patrick Mannion (second from left) of Test & Measurement World to show off their plaques. (Click image to enlarge.)