February 14, 2008

NASA develops integrated signal and image-processing software package
The NDE Wave and Image Processor software performs analysis and processing operations on digitized waveforms, images, and series of images, allowing you to extract specific information from signals and predict defects in physical items. Read More

Agilent probes access DDR2, DDR3 BGA memories
Agilent's DDR2 and DDR3 BGA probes provide direct access to the balls of DRAM chips with low loading and minimal impact to signal integrity. Read More

Inphi unveils 800-MHz DDR3 clock reference board
Designed specifically for high-performance RDIMM testing, Inphi's DDR3 clock reference board (CRB) performs beyond JEDEC DDR3-1600 specifications, achieving clock speeds of 800 MHz. Read More

IPC releases salary reports for PCB/EMS industries
Two biennial studies are now available from IPC: 2006-2007 IPC Wage Rate and Salary Report for the PCB Industry and 2006-2007 IPC Wage Rate and Salary Report for the Electronics Manufacturing Services (EMS) Industry. Read More

Negative-stiffness vibration isolators challenge passive system air tables
In a paper posted on its Web site, Minus K argues that its negative-stiffness isolators, which resonate at 0.5 Hz compared to the 2 Hz of air tables, are well-suited for applications involving scanning-probe microscopes and microhardness testers. Read More

New solutions to compliance headaches
In a recent interview, Jim Maginn of AR RF/Microwave Instrumentation discussed trends in EMC and RF test applications. Read More

UK group swats at teen-repelling Mosquito
I wrote in June 2006 about an ultrasonic teenager repeller that emits a 17-kHz tone that annoys children but is inaudible to adults. The product is so effective, it is inviting a backlash. Read M ore

A more liberal approach to engineering education
Even engineering programs have to keep up with the Joneses.  
Read M ore

Last chance: vote for the Test Product of the Year
Winners of the 2008 Best in Test Awards include a WiMAX tester, a digital multimeter, an area-scan camera, an IPTV probe, an SOC test cell, and boundary-scan software. Read about all 12 winners, and then cast your vote for the Test Product of the Year. Voting deadline is February 15. Read More

February issue looks at serial data testing
Read our February issue to learn how three engineers have taken different approaches to improve jitter and BER testing for SerDes devices. Plus, the February cover story explains how one provider of mixed-signal ICs employs innovative test-handling techniques to ensure the quality of the devices that it sells into communications, industrial, medical, and automotive markets. Read it today.

Oscilloscope Challenge: active vs. passive probes
Our February challenge question is now online:

Which statement about active and passive probes is most accurate?
Prize: TomTom ONE navigation system
Contest sponsor: Yokogawa

Take the Oscilloscope Challenge

Industry calendar of events
Upcoming events include Measurement Science Conference (March), APEX (April), and Sensors Expo (June). For more information about these and other test-related events, visit our online calendar.