April 1, 2008

T&MW announces 2008 award winners
Our April issue announces the winners of our 2008 industry awards. T&MW's readers have selected Hung Nguyen of Raytheon as the Test Engineer of the Year and have voted the N6705A DC power analyzer from Agilent Technologies as the 2008 Test Product of the Year. Plus, our editors have chosen the Yokogawa DL750 ScopeCorder as the Test of Time winner. Read More

MIMO challenges existing ATE
Before MIMO technology can become widely accepted, it will have to cost about the same as current wireless technology. This dictates that test-system manufacturers rein in test costs by developing automatic test equipment that can handle MIMO devices during high-volume production. Read More

Evaluating printed-circuit-board test options
"For a printed circuit board (PCB) manufacturer, testing presents a wide variety of both problems and opportunities," states the article "Practice makes perfect" on the IPC Website. Or as Rick Nelson says, it "is all a matter of art." Read More

Ansoft releases target high-speed-circuit and electromagnetic design
Ansoft has announced new releases of its Nexxim high-capacity circuit-simulation software and Ansoft Designer integrated schematic and design-management software, as well as new releases of its Maxwell electromagnetic field simulation software. Read More

Agilent's Cover-Extend technology eliminates need for physical test points for in-circuit test
The Agilent Cover-Extend technology is a hybrid between two established test methodologies in the electronic manufacturing industry: boundary scan and VTEP vectorless test. Read More

Teradyne introduces UltraWave 12-GHz instrument
UltraWave offers wireless customers including Broadcom 12-GHz source and measurement performance. Read More

Credence debuts digital instrument for Diamond series; Haier chooses Diamond 10
The DD1096-32 digital instrument offers 32-Mbit deep reconfigurable parallel vector memory and works with the Diamond 10 and Diamond 40 platforms. Haier will use the Diamond 10 to test the company’s consumer-geared ICs. Read More

Pintail teams with Avago to hone adaptive test software
Pintail Technologies, a supplier of adaptive test software for semiconductor manufacturing, announces that it will incorporate Avago's advanced outlier detection algorithms into its commercial software offerings. Read More

Curtiss-Wright employs XJTAG system for PCB testing
Curtiss-Wright Controls Embedded Computing has chosen XJTAG's IEEE 1149.1 JTAG-compliant boundary-scan development system to improve the process of debugging and testing its range of radar, video, and graphics products. Read More

Sockets for 0.65-mm-pitch LGAs
The XG-LGA-7000 sockets are designed for a 12-mm package size and operate at bandwidths to 40 GHz with less than 1 dB of insertion loss. Read More

As SOCs grow, instruments move on-chip
As system-level ICs grow larger and more complex, they become impossible to observe and stimulate. Yet, the need for capturing on-chip-signal information remains. Read More

New Oscilloscope Challenge: Which features aid troubleshooting?
Answer our April oscilloscope challenge question correctly, and you could be eligible to win a prize.

Question: Which oscilloscope features are useful for serial-data-bus troubleshooting?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Take the Oscilloscope Challenge

Industry calendar of events
Upcoming events include the Design Automation Conference (June) and Semicon West (July). For more information about these and other test-related events, visit our online calendar.