April 3, 2008

T&MW honors 2008 award winners
In a ceremony held in Las Vegas, NV, Test & Measurement World honored the winners of our 2008 test industry awards. Russ Pratt, publisher, and Rick Nelson, Editor in Chief, hosted the ceremony, during which we presented awards to the recipients of the Test Engineer of the Year award, the Best in Test awards, the Test Product of the Year award, and the Test of Time award. Read More

Design for dust
Just because you work in an air-conditioned office or a temperature-controlled lab doesn't mean your equipment won't suffer from indoor air pollution. You can guard against the negative effects of airborne pollution such as dust and moisture by designing products to meet insulation requirements. Read More

MIMO challenges existing ATE
Before MIMO technology can become widely accepted, it will have to cost about the same as current wireless technology. This dictates that test-system manufacturers rein in test costs by developing automatic test equipment that can handle MIMO devices during high-volume production. Read More

Guest Commentary:
Metrology personnel shortage is real
With the US facing a shortfall of technical professionals, concerned individuals and professional metrology organizations are taking steps to increase metrology awareness with an emphasis on education and training. Read More

Odds and ends: LEDs, waveguides, data acquisition
Brad Thompson comments on the recent trend toward blue LEDs, suggests a way to avoid bloodied knuckles, and describes an alternative data-acquisition and control software called EZGPIB. Read More

Iridescent future ahead for the oscilloscope market
Compared with other types of general-purpose test and measurement equipment, the oscilloscope market has witnessed the most technological innovations and changing market trends. Read More

Help with USB specs
A reader e-mailed with a question about inrush current in USB 2.0 devices. Can you help? 

Seica debuts Pilot V8 flying prober
Seica chose APEX to debut its Pilot V8 double-sided flying prober, which employs the vendor's vertical board-under-test architecture while accommodating eight electrical-flying-test probes. Read More

Dage XD7500NT features sealed x-ray tube
Dage Precision Industries chose APEX to announce its XiDAT XD7500NT digital x-ray inspection system with submicron inspection capability and sealed tube technology for maintenance-free operation. Read More

April issue profiles award winners
Learn more about the winners of our annual test industry awards by reading the features in our April issue. The issue also contains the Machine-Vision & Inspection Test Report, which covers ways to maximize inspection throughput of small components. Read it today! 

New Oscilloscope Challenge: Which features aid troubleshooting?
Answer our April oscilloscope challenge question correctly, and you could be eligible to win a prize.

Question: Which oscilloscope features are useful for serial-data-bus troubleshooting?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Take the Oscilloscope Challenge

Industry calendar of events
Upcoming events include the Design Automation Conference, The Vision Show, and the International Microwave Symposium, all scheduled for June. For more information about these and other test-related events, visit our online calendar.