T&MW's Test Industry News

 
May 1, 2008

Testing toward secure networks
When you make an online transaction or use a bank's teller machine, you trust that the financial institution's networks will protect your valuable information. Data centers of major financial institutions and other businesses use security platforms from Crossbeam Systems to protect their networks and your data. Read More

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Free Comprehensive Handbook for System Engineers

This 200+ page guide provides practical advice and real-world examples for building your system architecture, networking solutions and instrumentation hardware and software. Click here to learn more and order a copy.


Enabling seamless WiMAX fabric
Chipsets are emerging that add WiMAX capability to mobile PC and cellphone applications, while lab and production test equipment evolves to keep pace. Read More

Modified thermal chamber cuts EMI
RF ICs such as GSM SOC devices must operate within power and frequency limits over a specified temperature range. Guarding against unwanted signals and testing at specified temperatures are both easy to do, but not at the same time. Read More

Electrons remain important in electronics test
Test engineers are struggling to optimize PCB test and inspection strategies as board complexity increases and manufacturing gets outsourced. Finding the right mix of test and inspection technologies was the topic of a panel at APEX. Read More

Should intelligence be hidden?
Are embedded systems becoming too embedded? That's a feeling I get from two contrasting shows in San Jose last month. Read More

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Sensors Expo & Conference

June 9-11, 2008, Donald E. Stephens Convention Center in Rosemont, IL. The conference program features nine research-based technical tracks, including three all-new tracks. The expo hall brings together the largest showcase of sensing technologies and systems for attendees to evaluate and make informed decisions. Click here

The trifecta that almost everyone loses
The era of cheap goods is ending--that s the view from sources ranging from a variety of observers. Read More

Amid fanfare, Carl Zeiss SMT opens North American headquarters
At what the company billed as "the smallest ribbon-cutting ceremony in history," Carl Zeiss SMT opened its North American headquarters in Peabody, MA. Read More

PCB Piezotronics debuts mini MEMS shock accelerometers
Offered in both single-axis and triaxial configurations, the Series 3991/3993 MEMS-based shock accelerometers have a measurement range of 20,000 g and are intended for aerospace and defense applications. Read More

Ixia launches end-to-end service verification platform for
triple play

Using active customer traffic over the customer’s delivery path to validate service, the IxRave remote QoE and service validation platform measures true end-to-end performance for multiplay services across an entire network. Read More

B&K Precision software updates IC testers' device library
With B&K Precision's AK57X software kit, you can add functional tests for new ICs to the device libraries of the Model 570A analog and Model 575A digital handheld IC testers. Read More

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Six Best Practices to Design Test Systems for Scalability and Maintainability

In today's economic landscape, communications and high-tech electronics OEMs are constantly challenged to develop new strategies to become more effective in managing growth. Learn how you can create a foundation for test system scalability that will smooth your transition from NPI to high-volume production.
Date: Wednesday, June 4, 2008
Time: 2:00 pm ET/11:00 am PT
Sponsored by: Proligent/Averna in partnership with Test&Measurement World
Click here


New Challenge for May
Answer our May oscilloscope challenge question correctly, and you could be eligible to win a prize.

Question: Why do the rules for rise time differ in analog and digital oscilloscopes?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Take the Oscilloscope Challenge

Industry calendar of events
Upcoming events include Design Automation Conference, The Vision Show, and the International Microwave Symposium, all in June. For
more information about these and other test-related events, visit our online calendar.

 

A D V E R T I S E M E N T

"Dot6" boundary-scan test and diagnosis available NOW

Already using SERDES? Or planning it on your next design? Consider how to test AND diagnose those high-speed circuits. ProVision from JTAG Technologies fulfills the promise of IEEE 1149.6: automated test generation for LVDS and other advanced digital nets plus precise diagnosis of faults. Click here



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