T&MW's Test Industry News

 
May 8, 2008

100-Gbps Ethernet: In demand now
John D'Ambrosia of Force10 Networks is chair of the IEEE P802.3ba Task Force, whose job is to develop a standard for 40-Gbps and 100-Gbps communications links. Martin Rowe spoke to D'Ambrosia about the project and the growing demand for more bandwidth. Read More

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Green Engineering

Green engineering features measurement and control techniques to help you design, develop, and improve products and technologies resulting in environmental and economic benefits. Learn about the green engineering practices that are being developed and deployed with National Instruments technologies. Click here


Genetic algorithm solves thermistor problem
In an article posted on EDN.com, a strategic applications engineer at Maxim Integrated Products presented what he considers a quicker alternative than the standard numerous equations for finding an optimal solution to a multivariable problem. Read More

Online technical calculator
While browsing through a newsgroup, I came upon a posting for an online engineering calculator where you'll find calculators for numerous engineering fields such as electrical, electronics, physics, mechanical engineering, and chemical engineering. Read More

Chip-laden cars still opportunity for semiconductor companies
The automotive market would appear to be an attractive target for semiconductor manufacturers. But Brian Dipert of EDN is skeptical. Read More

Students get a chance to intern as CEO
The title CEO Intern seems inherently contradictory, but it is an accurate description of a student-focused reality show that is in the works for this summer. Read More

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The Total Lab Management and Automation Solution

MRV's test management and automation products increase the efficiency in the test lab environment enabling more tests in less time. Remote control and management of cable topologies, lab devices, power distribution and KVM optimize the lab for responsiveness and best use of capital expenditures.
See why the largest network equipment manufacturers use MRV's Test Management and Automation Solutions. Click here


Small-footprint scopes debug buses
The Tektronix DPO3000 two- and four-channel 100-, 300-, and 500-MHz-bandwidth oscilloscopes incorporate Tek's Wave Inspector technology, which facilitates searching through long waveform records for anomalous events. Read More

Simulate and develop wireless systems
Communications Blockset 4.0 extends Simulink from The MathWorks by adding code generation for simulating and designing the physical layer of wireless systems such as WiMAX. Read More

Mentor Graphics announces partnership with NXP for DFT
Mentor Graphics has announced a partnership with NXP Semiconductors in which NXP will use Mentor’s design-for-test (DFT) products, including the TestKompress compressed-pattern-generation and YieldAssist failure-diagnosis tools. Read More

Micro Photonics offers micro-CT attachment for SEMs
The Skyscan microtomography (micro-CT) attachment for scanning electron microscopes (SEMs) produces 3-D images that reveal the internal 3-D microstructure of an object without requiring any sample preparation. Read More

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Six Best Practices to Design Test Systems for Scalability and Maintainability

In today's economic landscape, communications and high-tech electronics OEMs are constantly challenged to develop new strategies to become more effective in managing growth. Learn how you can create a foundation for test system scalability that will smooth your transition from NPI to high-volume production.
Date: Wednesday, June 4, 2008
Time: 2:00 pm ET/11:00 am PT
Sponsored by: Proligent/Averna in partnership with Test&Measurement World
Click here


May issue looks at communications test
For our May cover story, we visited Crossbeam Systems to learn how the company's engineers test security platforms that are used by financial institutions and other businesses to protect their networks and your data. Another May feature discusses WiMAX chipsets and explains how test equipment is evolving to keep pace with this emerging technology. In this month's PXI Test Report, you can read about hybrid test systems that take advantage of multiple bus technologies. 
Read More

What do you know about rise time?
Answer our May oscilloscope challenge question correctly, and you could be eligible to win a prize.

Question: Why do the rules for rise time differ in analog and digital oscilloscopes?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Take the Oscilloscope Challenge

Industry calendar of events
Upcoming events include the The Vision Show (June), the International Microwave Symposium (June), and the EMC Symposium (August). For more information about these and other test-related events, visit our online calendar.

 

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Free Agilent Tips and Tricks for Using USB, LAN and GPIB

This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C. Click here to learn more.




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