T&MW's Test Industry News

 
June 5, 2008

From tape-out to yield
Nanometer semiconductor devices present significant validation, characterization, and analysis challenges as designs move from tape-out to high-volume production. To help chip makers get such devices to market quickly, Presto Engineering deploys a variety of test and analysis equipment and expertise. Read More

A D V E R T I S E M E N T

Wireless Technology

The explosive growth of the wireless industry is a driving force behind innovation in fields ranging from telecommunications to environmental research. Whether you're testing wireless devices or using them in your application, NI has a solution for you. Learn how you can benefit from using Wireless Technology. Click here


Design tradeoffs in data acquisition
When designing the analog signal path of a data-acquisition system, you'll need to make tradeoffs that will affect the system's overall performance. Read More

MEMS create 3-D inspection challenges
Microphones, accelerometers, pressure sensors, and many other products take advantage of a microelectromechanical system, or MEMS. Each MEMS device has its own peculiarities and structures that require a unique inspection "recipe." Read More

Opaque Windows
A petition created by InfoWorld requests that Microsoft extend support for Windows XP. Having spent the better part of a week resurrecting my PC and reinstalling Windows, I m not in the mood to adopt Microsoft s latest offering. Read More

Take a challenge, win a prize
Answer our June oscilloscope challenge question correctly, and you could be eligible to win a prize.

Question: Which waveform do you use to measure bandwidth?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Take the Oscilloscope Challenge

A D V E R T I S E M E N T

DOVEBID FEATURED ONLINE AUCTION

June 25 & 26, 2008
INXS, INC.
Electronic Test & Measurement Equipment
Preview Location: Delray Beach, FL USA
For further info, contact Doug Escudero or Click here


Make metrology a standard occupation (Guest Commentary)
Metrology is the bedrock upon which all US commerce and manufacturing is built, yet the Department of Labor (DOL) recently rejected a petition to recognize metrology job descriptions in its proposed 2010 Standard Occupational Classification System. Read More

Green engineering matures
The green age has arrived. Corporate responsibilities now seem to include addressing climate change and other environmental concerns, but along with the responsibilities come opportunities. Read More

FIRST program pays career dividends
Eli Seidner found his experience designing and building robots for the FIRST competitions was more relevant to his work as an applications engineer than his experience at RPI was. Read More

More on Bill and Dave
In a recent posting, "Tell your Bill and Dave Stories," I asked if the HP Way still exists and if so, where. One person who responded is John Minck, a longtime HP/Agilent employee whose says the HP way has attenuated. Read More

A D V E R T I S E M E N T

Webcast on Industrial Vision Systems - Migration from Analog to Digital Image Capture for Machine Vision

Analog cameras dominated the early years of machine vision systems, offering adequate performance, a simple interface, and a moderate price. Continuing technology advances, however, are now tipping the scales in favor of digital cameras for most new and many legacy applications. This webinar will examine the case for switching from analog to digital image capture and assess for themselves the benefits of going digital. Click here


Do you know an outstanding engineer?
The editors of Test & Measurement World are currently seeking nominations for the 2009 Test Engineer of the Year award. This annual award recognizes an individual who has tackled a tough engineering challenge, has provided invaluable industry leadership, or has otherwise demonstrated exceptional engineering competence and service. As part of the award, the recipient designatsd an engineering program to receive an educational grant courtesy of the award sponsors. Read about past winners and learn how to nominate a deserving colleague.

June issue covers communications test, machine vision
In our June issue, "Protocol stack testing for LTE" explains how effective test strategies can help transform UMTS into a cellular wideband system. Another article describes how engineers at Falcon Electric test the company's uninterruptible power supplies. And in his Tech Trends column, Martin Rowe discusses how oscilloscopes are supporting HDMI test. Plus, the issue also includes the Machine-Vision & Inspection Test Report. Read More

Industry calendar of events
Upcoming events include Semicon West (July), the EMC Symposium (August), and Autotestcon (September). For more information about these and other test-related events, visit our online calendar.

 

A D V E R T I S E M E N T

Free Agilent Tips and Tricks for Using USB, LAN and GPIB

This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C. Click here to learn more.



A D V E R T I S E M E N T


Advertisements