Test Voices  RSS

June 28, 2012

Members of the test industry step up to share their insights, observations, and questions.

Voice over LTE (VoLTE) impacts test & measurement market

Olga Shapiro, of Frost & Sullivan, reflects on how testing during the research and development phase of VoLTE has become absolutely critical for successful technology deployment and ensuring positive quality of user experience (QoE) Read More...

When is a multichannel power supply more convenient than a single-channel power supply?

Given that no equipment budget can afford every possible “bell and whistle” that test hardware vendors offer, it makes sense to ask which applications really demand a multichannel power supply and which ones don’t. Read More...

Consider time to market early in test process

Taking industrial test into account in the very first steps of the design flow should be strategic in every R&D design center that wants to target final market customers Read More...

Boost DFT efficiency for large SoCs

A core-based approach to design allows EDA tools to run more efficiently and enables multiple design blocks to be completed in parallel. Read More...

When do you need a multichannel picoammeter?

For many engineers, a picoammeter is the “go-to” instrument for a broad range of low current measurement applications when a digital multimeter’s (DMM) sensitivity is not enough. Read More...

What’s so scary about test automation?

Despite the obstacles, there are ways to prevail over testing monstrosities and automate all or part of test procedures. Read More...

Aren’t more bits better?

Factors to consider when looking at today’s high-resolution oscilloscopes Read More...

What does it take to boost quality and reliability?

If a test instrument goes down, you have to have spares on hand, rent a replacement, or do without for some period of time. All of these options cost you money or slow you down -- or both. Read More...

Slideshow: Test at DesignCon 2013

To many engineers, DesignCon has always been about test and measurement. Take a look at what was on display this year. Read More...

Optimizing autonomous IC test without sacrificing precision

For some designs the decision isn’t between using logic BIST or ATPG, but to how to use them together. Read More...

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