JTAG module tests DDR2 Mini DIMM 244 interfaces
Test Measurement World Staff - March 1, 2008
Goepel electronic’s Module/DIMM244so, a member of the company’s CION product family, is serially controlled via a boundary-scan test-access port (TAP), and it enables the testing of all signal and voltage supply pins of JEDEC-standard-compliant (JESD79-2C) DDR2 Mini DIMM 244-pin sockets.
The CION Module/DIMM244so plugs directly into the sockets to be tested. Because the modules are equipped with a transparent TAP, several boards of the same or different types can be cascaded in a daisy-chain configuration. The structural boundary-scan test of all DIMM 244 signal and voltage supply pins are executed by the onboard CION ASIC ICs. All channels can be independently switched as input/output/tristate. The Module/DIMM244so provides safety mechanisms to prevent damages in case of shorts or adverse voltage conditions.
The new hardware module is supported by Goepel’s ScanBooster and ScanFlex boundary-scan controller families as well as by the System Cascon integrated boundary-scan software platform.
Base price: $1000. Goepel electronic, www.goepel.com.