AFMs perform nanoelectrical characterization
Test & Measurement World Staff - August 24, 2012
KPFM (Kelvin probe force microscopy) is now available on Bruker’s Dimension Icon and MultiMode 8 AFMs (atomic force microscopes) for making quantitative nanoscale surface potential measurements. The optional PeakForce KPFM accessory uses frequency-modulation detection to deliver high-spatial-resolution Kelvin probe data for materials research and semiconductor applications.
PeakForce KPFM builds on Bruker’s PeakForce Tapping technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts. In addition, PeakForce KPFM features completely automated parameter setup with ScanAsyst.
The PeakForce KPFM option includes the complete set of industry-standard KPFM detection mechanisms (amplitude and frequency modulation), along with TappingMode and PeakForce Tapping. It also provides a high-voltage mode that extends the accessible potential range by more than a factor of 10.