Boundary-scan controller fits PXI Express slot
Test & Measurement World Staff - September 7, 2012
JTAG Technologies’ DataBlaster JT 37x7/PXIe boundary-scan controller supports the PXI Express/CompactPCI Express slot format found in automatic test equipment based on the PXI Express standard. It offers sustained test clock speeds of up to 40 MHz and provides onboard flash image buffer memory.
Outfitted with the QuadPOD system, the DataBlaster/PXIe controller provides four IEEE 1149.1-compliant synchronized TAPs (test access ports) that accommodate multi-TAP test targets or gang programming of four single TAP targets. QuadPOD can also house the full range of JTAG Technologies’ SCIL modules, allowing engineers to deploy custom test interfaces or the mixed-signal DAF (digital/analog/frequency) measurement module.
The scalable DataBlaster JT 37x7/PXIe controller is available in three application levels: 3707, 3717, and 3727. The entry-level 3707 model is suitable for high-speed test applications and in-system PLD programming. Companion 3717 and 3727 models, optionally fitted with an ETT (Enhanced Throughput Technology) module for flash ISP, support high-throughput flash programming, as well as test and PLD programming.
JTAG Technologies, www.jtag.com/en/Products/Hardware/Controllers