TERS probes advance AFM-Raman imaging
Staff - December 4, 2012Bruker has introduced a line of TERS (Tip-Enhanced Raman Spectroscopy) probes for its Innova-IRIS (Integrated AFM-Raman Imaging System) to provide a path to nondestructive, label-free chemical detection at the nanoscale. As sharp, solid-metal cones, the IRIS TERS probes achieve Raman enhancement of >10, which translates to high sensitivity and spatial resolution.
Together with Bruker’s Innova-IRIS system and a third-party research Raman system, the high-contrast probes help form a high-performance commercial TERS solution. Existing Innova-IRIS systems require only a new cartridge to start using the TERS probes, and any existing Innova AFM (atomic force microscope) can be upgraded to an Innova-IRIS AFM-Raman configuration. Implemented on the Innova-IRIS, the probes enable TERS on opaque samples using STM (scanning tunneling microscopy) feedback. The solid-gold probes are optimized for TERS enhancement at red and near-infrared Raman excitation wavelengths.
More information: www.bruker.com/en/products/surface-analysis/atomic-force-microscopy/innova-iris/overview.html
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