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Flicker noise system integrates DSA

Staff - February 3, 2013

NoiseProPlus 9812D, ProPlus Design Solutions’ wafer-level 1/f (flicker) noise-measurement system, delivers accurate measurement up to 10 MHz, while its built-in DSA (dynamic signal analyzer) eliminates the need for external signal-processing equipment.
The system measures low-frequency noise characteristics of on-wafer and packaged semiconductor devices, including MOSFETs, BJTs, JFETs, diodes, and diffusion resistors.

Built on the same foundation as its predecessor the 9812B, the DSA-equipped 9812D boasts a 3X to 10X throughput improvement for faster data collection and early detection of process issues. It also handles up to 100 V from the source-measure unit for high-voltage and/or low-current (<0.1 µA) biases. Additionally, the 9812D employs multiple voltage and current low-noise amplifiers to ensure high measurement accuracy.

NoiseProPlus software drives the system and provides enhanced usability and easier setup for full current-voltage characteristics, 1/f and RTS (Random Telegraph Signal) noise measurements, and graphical analysis of measured data. It can control a semiautomatic probe station for multiple-die, multiple-device, and multiple-type statistical noise measurements and has been optimized for processing and analyzing massive noise data.

ProPlus Design Solutions is accepting orders now for the 9812D. Shipping will begin in March.

NoiseProPlus 9812D product page

ProPlus Design Solutions, www.proplussolutions.com

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