May 6, 2008

Electrons remain important in electronics test
Test engineers are struggling to optimize PCB test and inspection strategies as board complexity increases and manufacturing gets outsourced. Finding the right mix of test and inspection technologies was the topic of a panel at APEX. Read More

How test fuels product development
In a recent interview, Pascal Pilon of Averna discussed the role of test engineering in new product development. Read More

Genetic algorithm solves thermistor problem
In an article posted on EDN.com, a strategic applications engineer at Maxim Integrated Products presented what he considers a quicker alternative than the standard numerous equations for finding an optimal solution to a multivariable problem. Read More

Embedded-instrument engineers join Asset InterTech, TRI integrates ScanWorks
Asset InterTech announced initiatives in embedded instrumentation and touted an agreement in which TRI will integrate Asset's JTAG tools into its test platforms. Read More

Mentor Graphics announces partnership with NXP for DFT
Mentor Graphics has announced a partnership with NXP Semiconductors in which NXP will use Mentor's design-for-test (DFT) products, including the TestKompress compressed-pattern-generation and YieldAssist failure-diagnosis tools. Read More

Pintail announces expanded adaptive-test software
The new SwifTest products offer users the ability to dynamically optimize test time and test coverage, improve device quality and reliability, and actively monitor and improve device yield during production testing at both wafer probe and final test. Read More

B&K Precision software updates IC testers' device library
With B&K Precision's AK57X software kit, you can add functional tests for new ICs to the device libraries of the Model 570A analog and Model 575A digital handheld IC testers. Read More

May issue looks at communications test
For our May cover story, we visited Crossbeam Systems to learn how the company's engineers test security platforms that are used by financial institutions and other businesses to protect their networks and your data. Another May feature discusses WiMAX chipsets and explains how test equipment is evolving to keep pace with this emerging technology. In this month's PXI Test Report, you can read about hybrid test systems that take advantage of multiple bus technologies. 
Read More

What do you know about rise time?
Answer our May oscilloscope challenge question correctly, and you could be eligible to win a prize.

Question: Why do the rules for rise time differ in analog and digital oscilloscopes?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Take the Oscilloscope Challenge

Industry calendar of events
Upcoming events include the Design Automation Conference (June), The Vision Show (June), and Semicon West (July). For more information about these and other test-related events, visit our online calendar.