July 1, 2008

STC to help test keep pace with design
Design productivity is outpacing test capabilities—that's one conclusion to be drawn from the global Semiconductor Test Consortium (STC) conference held in San Diego. That situation has implications for areas ranging from instrumentation to education, according to conference presenters. Read More

From system-level design to hardware prototypes
At the Design Automation Conference in Anaheim, CA, companies including STMicroelectronics, Mentor Graphics, Altrenta, and Calypto Design Systems highlighted their products. Read More

Verigy debuts Inovys Silicon Debug technology for V93000
Verigy has introduced the Inovys Silicon Debug technology to address the need for more efficient debug to accelerate time to volume production of new system-on-chip (SoC) devices. Verigy's new approach combines Inovys FaultInsyte software with the Verigy V93000 SOC test system. Read More

Credence and LTX sign merger agreement
Credence Systems and LTX have announced that they have entered into a definitive agreement to combine the two companies in a tax-free, all-stock "merger of equals." Read More

Agilent signal generators target production environments
The N5161A and N5162A MXG analog and vector RF signal generators from Agilent Technologies have been streamlined for ATE needs.
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From design to production
Stewart Wilde, a test-development engineer at International Rectifier responsible for test programming and design verification for packaged ICs used for power-monitoring and PWM applications, spoke about his work with Martin Rowe. Read More

Test's split personality
Upbeat and downcast. The mood of the test field's giant companies swung both ways in the turbulent year of 2007. Companies selling general-purpose test equipment notched respectable sales, and those with test platforms that target fast-growing communications applications like WiMAX reported banner years. Read More

2008 Buyer's Guide now online
T&MW's 2008 Buyer's Guide contains more than 300 product and service categories, divided into five main sections with a total of 26 subsections. Each category includes hotlinked vendor names.
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New challenges for July
Answer a challenge question correctly, and you could be eligible to win a prize.

Data-Acquisition Challenge:
Question: Which statement is true regarding the peak voltage?
Prize: TomTom ONE GPS
Sponsor: Data Translation

Oscilloscope Challenge:
Question: Which statement best describes chop and alternate modes?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Go to the Challenge Page

Industry calendar of events
Upcoming events include Semicon West (July), the International
Test Conference (October), and Electronica (November). For more information about these and other test-related events, visit our
online calendar.

A D V E R T I S E M E N T Measurement of Step-Down DC / DC Converters with Bode 100 This application note explains how to analyze the stability and the control loop behavior of DC power supplies containing step-down DC/DC converters. You will be given an insight on methods to assess the stability of switched mode power supplies. In addition you will be shown how you can visualize the influence of supply voltage or load changes. Click here!

A D V E R T I S E M E N T Quick Access to Application Notes, White Papers and More TMWorld.com's resource center provides you with free access to a growing library of assets that will help you in your job: Design Guides, Application Notes, White Papers, Tutorials and more. Visit our entire Resource Center Here

July Issue

A D V E R T I S E M E N T