August 7, 2008

Do you make enough money?
Read the results of our 2008 Salary Survey to learn whether your salary and benefits are competitive with your peers in the test-engineering industry. Read More

A D V E R T I S E M E N T Develop High-Performance Parallel Test Systems with NI LabVIEW 8.6 Test devices up to 10X faster than traditional instrumentation with National Instruments LabVIEW software. LabVIEW improves test throughput by creating parallel test applications that exploit the performance of multicore systems. Test a wide range of wireless protocols standards including, WLAN, WiMAX, DVB-T, and GPS. View demos and evaluate LabVIEW.Click here

Metrologists gather at Disney World
A keynote address at the annual NCSL International Workshop and Symposium covered the need to redefine the kilogram, while on the exhibit floor, vendors displayed new calibration products. Read More

Check ESD simulators first
Before running an immunity test, you should use a calibrated ESD target and a high-bandwidth oscilloscope to verify that your ESD simulator produces a current pulse with the proper shape and rise time. Read More

Test Ideas: Sync sine waves over three decades
Our debut Test Ideas column describes a circuit that can synchronize a sine-wave output through three decades of frequency, while maintaining low total harmonic distortion and constant amplitude. Read More

Master of multiplexing
For a growing number of life sciences testing challenges, the solution is bioassay analysis equipment produced by Luminex Corp. To produce high-throughput test results, the company employs a design and test effort that embraces a multitude of technologies in a high-performance flow cytometry instrument: fluidics, microspheres, optics, electronics, mechanics, and software. Read More

A D V E R T I S E M E N T Get More with Less Test Patterns • Learn more about Mentor's methodology to ensure a design works correctly after manufacturing • Use tools that add test circuitry (RTL or gate level) for design testability • Diagnose and facilitate failure analysis quicker and easier Find out more about TestKompress Xpress®. Download free whitepaper today!

Machine-vision industry experiencing trying times
A recent study from the Automated Imaging Association (AIA) reports that the machine-vision industry in North America is undergoing trying times, primarily due to the uncertain business cycle. Read More

LabView 8.6 adds wireless, enhances multicore and FPGA features
With LabView 8.6, you can develop and control a wireless sensor network that uses technologies such as Bluetooth, GPRS, and GSM. Read More

Goepel boundary-scan I/O modules test PCI Express slots
The CION Module/PCIe-x1 and CION Module/PCIe-x4 from Goepel enable structural test coverage of x1 PCI Express and x4 PCI Express slots in compliance with IEEE 1149.1 and IEEE 1149.6 standards. Read More

GL Communications rolls out handheld BER testers
Housed in compact hand-portable packages, LinkTest bit-error-rate testers from GL Communications can be used to test a wide variety of communications facilities and equipment. Read More

Teseq upgrades EMC test system for automotive tasks
Teseq's enhanced multifunction NSG 4070 EMC immunity test system now meets automotive industry standards for bulk current injection (BCI) test methods, including ISO 11452-4. Read More

Challenge yourself; win a prize
Answer a challenge question correctly, and you could be eligible to win a prize.

Oscilloscope Challenge:
Question: In an FFT, the frequency resolution is inversely proportional to what?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Data-Acquisition Challenge:
Question: Which kind of sensor typically uses six wires?
Prize: $300 American Express gift card
Sponsor: Data Translation

Go to the Challenge Page

Industry calendar of events
Upcoming events include Autotestcon (September), the International Test Conference (October), Vision 2008 (November), and Electronica (November). For more information about these and other test-related events, visit our online calendar.

A D V E R T I S E M E N T Free Agilent Tips and Tricks for Using USB, LAN and GPIB This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C. Click here to learn more.

August Issue

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