August 14, 2008

Credence debuts Diamond V/I instrument
The 72-channel HDVI (high density voltage/current) instrument is targeted at reducing the cost of test by enabling large numbers of sites to be tested in parallel. Read More

A D V E R T I S E M E N T Powerful New Vehicle Serial Bus Analyzer from Yokogawa Yokogawa's new SB5000 is capable of testing FlexRay, CAN, LIN, SPI, I2C, UART, and proprietary buses and 32-bit parallel logic. Now you can debug and troubleshoot bus problems due to noise, signal quality, timing and data errors with automated ease – leading you to a more reliable design. Learn More

From 14-sample/s DAQ to 6.6-GHz PXI—with a helping of software
Introductions by National Instruments at its annual NIWeek event included LabView version 8.6, Wi-Fi and Ethernet data-acquisition devices, 6.6-GHz PXI RF signal analyzers and generators, and reconfigurable I/O (RIO) devices. The company, in conjunction with Lego, announced a new educational robotics product. Read More

Optimize a digitizer's analog signal path
Mixed-signal ICs used in cellphones, DVD players, HDTVs, and set-top boxes require analog signal measurements during production. Therefore, the ATE systems used to test such products need amplifiers that provide a combination of high bandwidth and accuracy when digitizing signals. Read More

Don't monkey around with analog circuits
Engineers engaged in the test or data-acquisition function frequently need to design some analog circuits. For analog-design tips, you can't go wrong having Analog Circuits: World Class Designs on your bookshelf. Read More

A D V E R T I S E M E N T Kikusui introduces new products at IEEE EMC 2008 New products line up Includes upgraded ESD gun (KES4022), Harmonic/Flicker Analyzer (KHA3000) and KES7822S, the new field decay which complies with not only ISO standard but major Japanese automaker's unique standards. Kikusui also exhibits new regenerative DC electronic load to demonstrate its efficiency. Click here

AOI inspection systems incorporate multiple capabilities
Stacy Johnson, Agilent Technolgoies' Americas marketing development manager, discussed the current trends in automated optical inspection systems and explained that software is the key to her company's Medalist sj5000 system. Read More

Goepel boundary-scan I/O modules test PCI Express slots
The CION Module/PCIe-x1 and CION Module/PCIe-x4 from Goepel enable structural test coverage of x1 PCI Express and x4 PCI Express slots in compliance with IEEE 1149.1 and IEEE 1149.6 standards. Read More

A D V E R T I S E M E N T The Total Lab Management and Automation Solution MRV's test management and automation products increase the efficiency in the test lab environment enabling more tests in less time. Remote control and management of cable topologies, lab devices, power distribution and KVM optimize the lab for responsiveness and best use of capital expenditures. See why the largest network equipment manufacturers use MRV's Test Management and Automation Solutions. Click here

GTRI to develop test program for US unmanned systems
The Georgia Tech Research Institute has won a contract to support the development of a roadmap designed to improve the testing and evaluation of unmanned and autonomous systems for the US Office of the Secretary of Defense. Read More

Do you make enough money?
Read the results of our 2008 Salary Survey to learn whether your salary and benefits are competitive with your peers in the test-engineering industry. Read More

Take a challenge, win a prize
Answer a challenge question correctly, and you could be eligible to win a prize.

Oscilloscope Challenge:
Question: In an FFT, the frequency resolution is inversely proportional to what?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Data-Acquisition Challenge:
Question: Which kind of sensor typically uses six wires?
Prize: $300 American Express gift card
Sponsor: Data Translation

Go to the Challenge Page

August issue now online
In our August cover story, we explain how engineers at Luminex Corp. test their high-throughput bioassay analysis equipment. Another feature dissects the dynamic range specification of spectrum analyzers, and a third describes how to verify the output of an ESD simulator. Plus, the issue also includes the Machine-Vision & Inspection Test Report.
Read it today

Industry calendar of events
Upcoming events include Autotestcon (September), the International Test Conference (October), and Vision 2008 (November). For more information about these and other test-related events, visit our
online calendar.

A D V E R T I S E M E N T Add boundary-scan easily into your functional test JTAG Technologies' new RMI controller streamlines combining boundary-scan structural testing and ISP with your functional test. RMI is a complete 19” rack-mounted controller with four front-panel PODs and 256 digital I/Os. Regardless of the format of your test station (PXI, VXI, custom), RMI is the easiest way to incorporate boundary-scan.Click here

August Issue

A D V E R T I S E M E N T