September 4, 2008

An RFIC for the world
When you travel overseas, do you need to switch cellphones because yours isn't compatible with the network? Have you had to replace a phone because your carrier upgraded to a new network? If so, then you'll appreciate the work being done at BitWave Semiconductor. Read More

A D V E R T I S E M E N T Design-for-Test Online Technical Library! Visit the online technical library for informative presentations and product demos on the latest design-for-test technology: • Advanced approaches to reduced pin count testing • TestKompess compactor and beyond with several new online presentations • Yield learning and analysis and coping with the new breed of defect Download today! Click here

Measure power-supply loop transfer
Power supplies use control-loop circuits to produce constant voltage or current. Knowing a control loop's transfer function (gain and phase as a function of frequency) can help you select the right compensation and power-stage components. Read More

Thermography and the detectors that make it work
"Ultimate" is a risky tag to assign to one's literary efforts, and an infrared (IR) expert might not think a 40-page book could warrant that tag. But this short book provides a wealth of valuable introductory information as well as specific information you can apply on the job. Read More

RF switches for PXI begin proliferation
Growing interest in PXI as an RF test platform has stimulated demand for high-density RF switching modules. The result has been a jump in the range of switch configurations available, but with one drawback. Read More

New challenge questions posted for September
Answer a challenge question correctly, and you could be eligible to win a prize.

Data-Acquisition Challenge:
Question: Which type of sensor needs no excitation voltage or current, thus no external power source?
Prize: Three $100 American Express gift cards (three winners of $100 each)
Sponsor: Data Translation

Oscilloscope Challenge:
Question: What is the relationship between an oscilloscope and a time-domain reflectometer, and how can either or both be used to troubleshoot serial buses?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Go to the Challenge Page

A D V E R T I S E M E N T Geotest – Marvin Test Systems, Inc. to Unveil New Software and Hardware Products at AUTOTESTCON 2008 Geotest will be showcasing the latest release of ATEasy – version 7.0 - a complete test executive and development environment designed specifically for T&M applications. Two new preconfigured PXI test platforms for avionics maintenance test and repair applications will also be debuted. Visit us at Booth #837 and enter your name to win an Ipod. Click here

A new generation of nerds
Nerd is typically not a highly sought after title, but there are a group of female engineers from Tufts University out to prove they live up to the name. The Nerd Girls are a group of 16 female engineering students who are featured in a reality series. Read More

Criticizing automated umpires: throw the 'bots out?
Should technology replace human referees in sports events? Are robotic umps a good idea? Read More

Teradyne to acquire Eagle Test Systems
Teradyne and Eagle Test Systems today announced that they have signed a definitive agreement under which Teradyne will acquire Eagle Test. Under the terms of the agreement, Eagle Test shareholders will receive $15.65 per share in cash. The aggregate purchase price is expected to be approximately $250 million. Read More

TI touts support for IEEE 1149.7 standard
Texas Instruments, a member of the IEEE11.9.7 working group, announced that it is actively supporting the ratification of IEEE 1149.7, a new 2-pin test and debug interface standard that employs half the number of pins of the IEEE 1149.1 technology. Read More

September issue looks at board test
One feature in our September issue describes three projects initiated by iNEMI (International Electronics Manufacturing Initiative) that aim to help manufacturers improve the quality of printed-circuit boards (PCBs). Articles in our Test Digest section explain the importance of measuring magnetic fields and how enterprise software enables engineers to share data. The issue also includes the PXI Test Report. Read it today

Industry calendar of events
Upcoming events include the International Test Conference (October), Vision 2008 (November), and Electronica (November). For more information about these and other test-related events, visit our online calendar.

A D V E R T I S E M E N T Webcast: Learn How LXI Can Improve Your Test Applications Leverage the Ethernet/Web with the LXI Standard. This webcast, moderated by TMW editor Rick Nelson, shows how to create more powerful test systems in less time, with greater flexibility. Presentations will be from Agilent, NI, The Mathworks, and VXI Tech. Register here for this event, September 24, 2 p.m. EASTERN, or visit our site.

September Issue

A D V E R T I S E M E N T