T&MW's Machine-Vision & Inspection News

September 23, 2008

Making the right color match
Most machine-vision installations rely on black-and-white images, but increasingly color is becoming a necessity. Read More

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New Webcast: The Fundamentals of Signal Integrity

Get valuable insight into solving signal integrity problems in digital systems. Discover their causes, characteristics, effects, and solutions. Learn how to create digital signals with good integrity - signals that have clean, fast transitions, stable and valid logic levels, accurate placement in time, free of any transients. Register now!

Thermography and the detectors that make it work
"Ultimate" is a risky tag to assign to one's literary efforts, and an infrared (IR) expert might not think a 40-page book could warrant that tag. But this short book provides a wealth of valuable introductory information as well as specific information you can apply on the job. Read More

Microscan to acquire Siemens' M-V business
Microscan has announced plans to acquire the machine-vision business of Siemens, formerly Acuity CiMatrix, the developer of the 2-D Data Matrix code. Read More

Sensoray unveils 16-channel PCI Express frame grabber
The Model 817 PCI Express JPEG frame grabber captures 16 separate channels of compressed JPEG or uncompressed bit maps at 480 total fps. Read More

Stemmer announces CVB version 10
In addition to CVB’s hardware independence and connection flexibility, Version 10 includes a new optimized installation routine and support for the 32-bit version of Microsoft Windows Vista. Read More

Point Grey enters USB 2.0 digital camera market
Joining Point Grey Research's existing line of FireWire digital imaging products are cameras incorporating USB 2.0 interfaces. Read More

Basler adds color models to line-scan camera family
To supplement its high-sensitivity sprint family of line-scan cameras, Basler Vision Technologies now offers color cameras with resolutions of 2000 pixels, 4000 pixels, and 8000 pixels. Read More

FEI's field emission gun shines brighter
FEI's extreme field emission gun electron source module combines higher brightness—previously available only with more complex cold field emission—with the high, ultra-stable current of thermally assisted field emission. Read More

How does your salary compare?
Read the results of our 2008 Salary Survey to learn whether your salary and benefits are competitive with your peers in the test-engineering industry. Read More

Take a challenge, win a prize
Answer a challenge question correctly, and you could be eligible to win a prize.

Oscilloscope Challenge:
Question: What is the relationship between an oscilloscope and a time-domain reflectometer, and how can either or both be used to troubleshoot serial buses?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Data-Acquisition Challenge:
Question: Which type of sensor needs no excitation voltage or current, thus no external power source?
Prizes: Three $100 American Express gift cards (three winners of $100 each)
Sponsor: Data Translation

Go to the Challenge Page

September issue looks at board test
One feature in our September issue describes three projects initiated by iNEMI for improving the quality of printed-circuit boards. Another explains how to measure a control loop's transfer function so you can select the right compensation and power-stage components. The issue also includes the PXI Test Report. Read it today

Industry calendar of events
Upcoming events include the International Test Conference (October) and Vision 2008 (November). For more information about these and other test-related events, visit our online calendar.

 

A D V E R T I S E M E N T

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