October 28, 2008

CMOS cameras rival their CCD cousins
Newer sensor technology has led to improved light-sensitivity levels and has helped reduce noise levels in the CMOS-based cameras that are penetrating high-speed machine-vision applications. Read More

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Final Call for Nominations: Best in Test Awards
Time is running out. Nominations for Test & Measurement World's 2009 Best in Test and Test of Time awards are due November 5. Submit your nomination today! Read More

GigE Vision expands in machine vision
Perhaps GigE Vision's main benefit is its 125-Mbps speed, which allows what previous Ethernet standards did not: the ability to reliably handle streaming, uncompressed image data and transmit that data over cables as long as 100 m. Read More

SEM technology sees below 1 nm
As semiconductor process geometries shrink to the 32-nm node and below, obtaining clear images of IC structures is becoming a lot tougher. To address this problem, FEI has a developed a new class of instruments called extreme high-resolution scanning electron microscopes (XHR SEMs). Read More

Cognex extends vision sensor capabilities
Cognex has introduced the Checker 252, a device that includes all the inspection capabilities of its predecessors, plus the ability to perform pass/fail inspection of height, width, and diameter on high-speed production lines. Read More

GigE cameras provide PoE
A new line of Gigabit Ethernet cameras from Baumer provide power over the Cat6 Ethernet cable, eliminating the need for a separate power cable. Read More

Edmund Optics expands USB 2.0 camera line
Edmund Optics recently added HE (harsh environment) and LE (lite edition) models to its line of USB 2.0 machine-vision cameras. Read More

IDT shrinks high-speed camera for automotive testing
The miniature Redlake N-Series camera from IDT (Integrated Design Tools) is smaller, lighter, and faster than comparable cameras used for automotive testing, according to the manufacturer. Read More

EDN announces annual Innovation Awards
EDN proudly announces its 19th annual Innovation Awards program. Nominate your company's engineers and products for recognition in this prestigious program. The deadline is November 26, 2008, so don't delay. Read More

Vote for the 2009 Test Engineer of the Year
The six finalists work at St. Jude Medical, Ford Motor, Seagate Technology, Sanmina-SCI, Battelle Memorial Institute, and National Institute of Standards and Technology. Read all about them and then cast your ballot. The winner will designate a $10,000 donation to an engineering school, courtesy of National Instruments. Read More

Last week to take an October challenge
Answer one of our October challenge questions correctly, and you could be eligible to win a prize.

Oscilloscope Challenge:
Question: Which of the following is an oscilloscope display mode that can facilitate jitter measurements on high-speed serial data lines?
Prize: TomTom ONE GPS
Sponsor: Yokogawa

Data-Acquisition Challenge:
Question: What is the potential role of LXI in data-acquisition applications?
Prizes: Three $100 American Express gift cards (three winners of $100 each)
Sponsor: Data Translation

Go to the Challenge Page

Industry calendar of events
Upcoming events include Electronica (November) and The Vision Show (March). For more information about these and other test-related events, visit our online calendar.