T&MW's Communications Test News

December 8, 2008

VeriWave adds test capability for multigigabit WLAN controllers
Using VeriWave’s new four-port 802.11n SISO (single input single output) WaveBlade, network equipment manufacturers can avoid manual testing and shorten test cycles by up to six months by performing comprehensive control-plane and data-plane testing of WLAN controllers scaling beyond 30 Gbps of traffic. Read More

A D V E R T I S E M E N T

Attend Agilent's Virtual Expo: Connecting Experts with Experts – Live Dec 10th

This Expo brings product and technology experts to your desktop. You'll see a range of products, from handheld multi-meters to high performance oscilloscopes and learn about the latest technology advancements in RF and digital test. On Dec 10th our featured webcast focuses on RF/Microwave switch considerations. To learn more or register, Click here

EXFO multiservice modules perform multistream testing
By providing the ability to configure multiple streams, the EXFO Power Blazer modules allow network operators to simulate and qualify different types of applications running over their networks. Read More

Anite launches Mobile WiMAX protocol stack tester
Aimed at mobile handset and base station developers, Anite's Mobile WiMAX HT (Host Tester) allows users to test a protocol stack in isolation of any hardware. Read More

GL Communications enhances T1 E1 product lineup
GL Communications announced the release of Version 5.18 of its T1 E1 analyzer software, which provides analysis and emulation capabilities for voiceband and signaling protocol analysis. Read More

A D V E R T I S E M E N T

Get Competitive Bids on Industrial Purchases

Compare prices for industrial and materials handling equipment, business services and more! Start saving today by getting FREE price quotes from BuyerZone - Where Smart Businesses Buy and Sell.
Click here

Multi-Contact has launched the Isoprobe III high-frequency test probes
The Isoprobe III probes have a coaxial connecting cable with low capacitance, which produces a low input capacitance and rapid rise times when combined with changes to the interior of the probe.
Read More

MRV's system automates 8-Gbps Fibre Channel test
MRV Communications has added a physical-layer chassis and interface blade for high-port-density, 8-Gbps Fibre Channel testing to its MCC (Media Cross Connect) family of physical-layer switches. Read More

Aeroflex bench test set eases 3GPP E-UTRAN work
The 7100 digital radio test set from Aeroflex enables chip-set designers, software developers, and handset manufacturers to accelerate the pace of development projects to meet the requirements of the 3GPP Rel-8 E-UTRAN standard. Read More

BNC rolls out 50-MHz function/arbitrary waveform generator
The Model 645 from Berkeley Nucleonics addresses many different applications, including bench research and development, radar simulation, and circuit testing. Read More

VTI Microwave unveils DC-to-40-GHz switching platform
A high-density, modular switching platform from VTI Microwave, the EX72SF is capable of housing up to six multi-throw and six SPDT RF/microwave latching relays in its 2U rack mainframe. Read More

JDSU acquires Circadiant for SFP+ and 10 GigE stress testing
JDSU has acquired Circadiant to expand its product portfolio, test expertise, and customer relationships with leading network-equipment manufacturers, optical-module vendors, and semiconductor companies. Read More

Do you make enough money?
Read the results of our 2008 Salary Survey to learn whether your salary and benefits are competitive with those of your peers in the test-engineering industry. Read More

Industry calendar of events
Upcoming events include OFC/NFOEC 2009 and APEX, both scheduled for March. For more information about these and other test-related events, visit our online calendar.

 

A D V E R T I S E M E N T

On Demand: SIA Annual Semiconductor Industry Global Sales Forecast

On Wednesday, November 19, the SIA released its annual forecast for global semiconductor sales. View this webcast for a discussion and analysis of what may lie ahead for the global chip industry with SIA President George Scalise. Register Now!
Sponsored by: TSMC & Accenture


Award finalists to be announced December 22
Be sure to check the Test & Measurement World Website on December 22 for our December/January issue, which reveals the finalists for the 2009 Best in Test and Test of Time awards.
Learn more about our awards programs.


A D V E R T I S E M E N T


S P O N S O R E D

Read Evaluating Oscilloscopes for Best Signal Visibility by Agilent
in the TMWorld.com Resource Center
This application note reviews some of the factors that impact oscilloscope update rates and shows you how to compute probabilities of capturing infrequent events.


 

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