January 6, 2009

LTX-Credence introduces digital options for X-Series test systems
The FX2 offers double the digital pin count per instrument of the current FX1 digital subsystem, and the FX-HS provides a combination of hardware and software features targeted at the test requirements of high-speed I/O. Read More

A D V E R T I S E M E N T Live Webcast: 7 Ways a New Test Engineering Platform Will Help You Cut Costs in 2009 by Averna Technologies With the recent economic shift, OEMs are challenged to reduce the cost of manufacturing and test, yet deliver the same or better product quality. In this live webinar, you'll learn seven ways that a centralized test platform will help you establish a more efficient test process, so you can trim costs and stay competitive. Register today!

Tune and test DDR memory
Modern electronic devices rely on stable DDR memory for fast, reliable operation. Even intermittent memory failures can lead to a costly recall. To minimize that risk, you can follow a comprehensive memory tuning and testing process that you can verify with an oscilloscope or logic analyzer. Read More

Diagnosis-driven yield analysis
Numerous challenges have to be overcome during design and production of ICs below 90 nm. Manufacturing processes are still being characterized, and the interactions between the physical processes and design features can be extremely subtle and difficult to identify. As a result, meeting yield goals is a bigger challenge than it was at larger technology nodes, and this has a direct impact on profits. Read More

Vote for the Best in Test 2009
Our editors have selected the finalists for the Best in Test awards and the Test of Time award. Read about the finalists and help us choose the best of the best. Voting deadline is February 6, 2009. 
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Make mine melamine
At WinCycle.org, we refurbish PCs for reuse by other nonprofit organizations. One recent arrival from a local business contained a shipment of several hundred HP Compaq d530SFF desktop PCs, some of which exhibit an interesting and spectacular failure mode. Read More

RoHS standards present moving target
One challenge to ensuring that electronic products conform to industry regulations is that those regulations often seem arbitrary. Just when companies think they have made sufficient plans to conform, the rules change. Read More

A D V E R T I S E M E N T Get the Latest Consumer Electronics News! TWICE.com (This Week in Consumer Electronics) is the official online news channel for CES 2009! Visit the site to check out the latest news and videos related to the show. Be the first to learn about what is happening in this rapidly changing market! Click here

Corelis expands platform support for boundary-scan tools
Corelis has created an enhanced QATP environment that expands support of Windows XP 64-bit, Windows Vista 32-bit, and Windows Vista 64-bit operating systems for its ScanExpress boundary-scan product portfolio. Read More

FormFactor probe card targets 300-mm DRAM wafer test
FormFactor'sHarmony eXP can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full 300-mm DRAM wafer. Read More

Keithley component test software offers curve tracing
Joining Keithley's ACS (Automated Characterization Suite) for semiconductor characterization, the ACS Basic Edition package performs both basic curve tracing and parametric test. 
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A D V E R T I S E M E N T Get Competitive Bids on Industrial Purchases Compare prices for industrial and materials handling equipment, business services and more! Start saving today by getting FREE price quotes from BuyerZone - Where Smart Businesses Buy and Sell. Click here

Industry calendar of events
Upcoming events include Measurement Science Conference, APEX, and The Vision Show, all scheduled for March. For more information about these and other test-related events, visit our online calendar.

December/January Issue

S P O N S O R E D Featured Application Note: Data logging on the 884X with TrendPlot by Fluke Corporation in the TMWorld.com Resource Center This paper discusses the Fluke 884X – the first precision multimeter to offer a simple method of capturing and displaying measurement changes as small as parts per million in real time, without time-consuming set-up or custom programming.