Date: Various

Location: Various

This three-day course consists of two parts. The first part, Design for Testability, provides guidelines for improving circuit design from a test perspective.The second part, Built-In Test, introduces the building blocks of built-in self-test (BIST) architectures. BIT software and BIT false alarms are also covered. Special emphasis will be given to boundary scan (the IEEE-1149.1, or JTAG, standard).

Cost: $2295. Locations include Dallas and Boston.

Presented by A.T.E. Solutions

www.besttest.com/Courses/00001-DFTBIST.cfm