All Webcasts
Signal Integrity Design Using Fast Channel Simulation and Eye Diagram Statistics
Date: July 29, 2009 (Available until July 30, 2010) Sponsors: Agilent Technologies, EDN, and Test & Measurement World. Improvements to traditional SPICE-type simulation have increased signal integrity channel simulation speeds to thousands of bits per minute. This webcast will demonstrate the "what if" design space exploration workflow that Agilent Technologies' new million-bit-per-minute channel simulator and eye diagram tool enables. more >> 
 Posted: Jun 24, 2009 | Permalink
FCoE Test Challenges
Date: March 24, 2009 (Available until March 25, 2010) Sponsors: Finisar Company and Test & Measurement World. This presentation will discuss the challenges brought by Fibre Channel over Ethernet (FCoE) technology from the testing perspectives, in particular how to measure Fibre Channel characteristics on Ethernet links. more >> 
Posted: Mar 11, 2009 | Permalink
EM Tools for Designing Circuits, Packages, and Connectors
Date: February 19, 2009 (Available until February 20, 2010) Sponsors: Agilent Technologies, EDN, and Test & Measurement World. This webcast will show you how Agilent's EEsof EDA portfolio assures design success from circuit level up to the highest levels of integration. more >>
Posted: Feb 2, 2009 | Permalink
4G MIMO Antenna Design on a Small Budget
Date: February 17, 2009 (Available until February 18, 2010) Sponsors: Agilent Technologies, EDN, and Test & Measurement World. Learn antenna design basics and how to design MIMO antennas for 3G/4G devices on a small budget using Agilent Genesys cost-effective EDA solution. more >>
Posted: Feb 2, 2009 | Permalink
Power Supply Measurement and Analysis
Date: February 24, 2009 (Available until February 25, 2010) Sponsors: Tektronix, Inc., EDN, and Test & Measurement World. Today’s power supplies are driving to a level of efficiency never seen before. This webcast will explore the required measurements to validate and characterize each section of a common switch-mode power supply. more >>
Posted: Jan 23, 2009 | Permalink
Device Test Considerations for CDMA2000/EV-DO to LTE Technology Migration
Date: February 12, 2009 (available until February 12, 2010). Sponsors: Anritsu, EDN, and Test & Measurement World. Live Webcast: As CDMA operators transition to LTE for their next generation wireless networks, this timely seminar provides an understanding of requirements for device testing including CDMA2000/EV-DO to LTE mobility and System Selection scenarios. Sponsored by Anritsu, Hosted by EDN and T&MW. Register Today! more >>
Posted: Jan 14, 2009 | Permalink
7 Ways A New Test Engineering Platform Will Help You Cut Costs In 2009
Date: January 21, 2009 (available until January 21, 2010). Sponsors: Averna and Test & Measurement World In this live webinar, you'll learn 7 ways that a centralized test platform will help you establish a more efficient test process, so you can trim costs and stay competitive. more >>
Posted: Dec 22, 2008 | Permalink
Back-to-Basics: Channel modeling and 'what if' analysis for signal integrity applications
Date: January 15, 2009 (available until January 15, 2010). Sponsors: Agilent Technologies, EDN, and Test & Measurement World. Watch a rapid technique “what if” analysis for signal integrity applications. In this webcast with live Q&A, learn a faster, more thorough approach to explore the design space than "iterating the hardware to success.” more >>
Posted: Dec 12, 2008 | Permalink
Back-to-Basics: Measurement-Based Channel Modeling for Signal Integrity using Agilent ADS
Date: October 23, 2008 (available until October 23, 2009). Sponsor: Agilent Technologies. Watch a rapid technique “what if” analysis for signal integrity applications. Learn a much faster, more thorough approach to explore the design space than "iterating the hardware to success.” more >>
Posted: Nov 10, 2008 | Permalink
The Fundamentals of Signal Integrity
Date: September 30, 2008 (available until September 30, 2009) Signal integrity measurements have become a critical step in the process of developing digital systems. Yet evolving technology makes it increasingly difficult for system developers to produce and maintain complete, unimpaired signals in digital systems. more >>
Posted: Sep 18, 2008 | Permalink
Advertisement
|
Advertisements
|
|
|
|