Test & Measurement World Webcasts
Featuring engineering experts from test, measurement, and vision companies, these Webcasts provide tips for solving test problems. Each Webcast lasts approximately 1 hour and includes a question-and-answer session.
All Webcasts are free of charge but require registration.
Six best practices to design test systems for scalability and maintainability
In today's economic landscape, OEMs of communications and high-tech electronics are constantly challenged to develop new strategies to become more effective in managing growth. Learn how you can create a foundation for test system scalability that will smooth your transition from NPI to high-volume production.
Date: Wednesday, June 4, 2008 (available on demand until June 5, 2009)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Proligent/Averna in partnership with Test & Measurement World
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Inject pulses into circuits and test for EMI immunity
EMC expert Doug Smith discusses how to troubleshoot for EMI immunity. Smith will present a technique for inductively coupling pulses into circuits for troubleshooting designs. Engineers can easily inject dozens of volts into cables and troubleshoot ESD problems.
Date: Friday, April 18, 2008 (available on demand until April 17, 2009)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Test & Measurement World
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Benefits of Real-Time Analysis Techniques and Measurements for Radio Communications
Real-time analysis has undergone rapid transformation in the advent of modern digital radio development. As the processing power of the computer world blends into the world of RF, the resulting Digital RF technologies require new real-time tools for development and analysis.
Date: Tuesday, April 15, 2008 (available on demand until April 14, 2009)
Time: 12:00 PM ET / 9:00 AM PT
Sponsored by: Tektronix in partnership with Test & Measurement World and EDN
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Develop Better Test Systems with Advanced Data Management 
Learn how the best practitioners in communications and electronics rely on proven, cost–effective, off-the-shelf test data management solutions to accelerate and simplify test system development, while increasing control of their remote test activities.
Date: Wednesday, March 19, 2008 (available on demand until March 18, 2009)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Proligent/Averna in partnership with Test & Measurement World
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Overview of the Latest Test Methodologies for High Speed Serial Designs
In this webinar we will touch on the most common as well the as the most challenging measurement tasks and how Tektronix solutions can help to better characterize and validate your high speed design.
Date: Monday, March 17, 2008 (available on demand until March 16, 2009)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Tektronix in partnership with Test & Measurement World and EDN
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Embedded Design Techniques for Optimizing Control Parameters
This Webcast shows how today’s design tools enable faster real-world measurements and simpler determination of optimal design settings. We will discuss how flash memory, flexible development environments, and the capabilities of modern deep-memory, mixed signal oscilloscopes help monitor many points simultaneously, and combine to form a powerful solution toolkit.
Date: Wednesday January 23, 2008 (available on demand until January 22, 2009)
Time: 12:00 PM ET / 9:00 AM PT
Sponsored by: Tektronix in partnership with Test & Measurement World and EDN
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Six hints for better scope probing
In this web seminar, you will learn six useful hints for making better oscilloscope measurements. After attending you will be able to avoid most common probing pitfalls.
Date: Wednesday, December 12, 2007 (available on demand until December 11, 2008)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Agilent Technologies in partnership with Test & Measurement World and EDN
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Advanced Radar Measurements
The seminar will discuss some of the latest measurements for chirped Radar, Hopped Radar, and very wideband Radars. Measurement results will be shown for pulses with 10 to 100 MHz width, as well as extremely wideband chirps 2 GHz wide.
Date: Wednesday November 28, 2007 (available on demand until November 27, 2008)
Time: 12:00 PM ET / 9:00 AM PT
Sponsored by: Tektronix in partnership with Test & Measurement World and EDN
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Maximizing the Impact of Test Engineering
Design and test engineers facing these pressures will learn about Enterprise Test Software (ETS), an innovation designed to integrate and synchronize test systems to other enterprise functions such as R&D, NPI, and manufacturing.
Date: Wednesday, December 5, 2007 (available on demand until December 4, 2008)
Time: 3:00 PM ET / 12:00 PM PT
Sponsored by: Proligent/Averna in partnership with Test & Measurement World
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Pass PCI Express Physical Layer Compliance Testing the First Time
With the PCIe 2.0 specification, 5.0 GT/s as well as 2.5 GT/s receiver testing are emerging as a key requirement for chip designers and add-in card vendors. In this seminar we look at why the requirements have been set the way they have, and some of the practicalities of making the measurement.
Date: Tuesday, December 11, 2007 (available on demand until December 12, 2008)
Time: 1:00 PM ET / 10:00 AM PT
Sponsored by: BertScope in partnership with Test & Measurement World and EDN
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How to Solve DDR Signal Integrity Validation Challenges
This presentation outlines the challenges as well as the probing methods and tools for DDR signal validation. These methods are applicable for DDR, DDR2, DDR3 and SDRAM side of Fully Buffered DIMM system debug.
Date: Thursday, October 18, 2007 (available on demand until October 17, 2008)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Agilent Technologies in partnership with Test & Measurement World and EDN
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Date: October 10, 2007 (available on demand until October 9, 2008)
Time:1:00 PM ET / 10:00 AM PT
Sponsored by: VI Technology in partnership with Test & Measurement World
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New Approach to Logic Design: A Shift in the Paradigm from Design for Test to Design with Test
This Webcast will teach you how to effectively design, verify, and implement fully testable RTL block and chip-level designs with minimal iterations.
Date: September 26, 2007 (available on demand until September 25, 2008)
Time: 1:00 PM ET / 10:00 AM PT
Sponsored by: Cadence in partnership with Test & Measurement World
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The A B C-V’s of Accurate Impedance Measurements on Wafer
This Webcast will cover trends in impedance measurement, the importance of accurate impedance measurements in the device design and process control activities, and differences among the generally accepted methods for measuring impedance.
Date: September 27, 2007 (available on demand until September 26, 2008)
Time: 12:00 PM ET / 9:00 AM PT
Sponsored by: SUSS MicroTec in partnership with Test & Measurement World and Semiconductor International
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Successfully Negotiating the PCI Express 2.0 Super Highway Towards Full Compliance
Enforcement of the PCI Express 2.0 standard will soon be required by the PCI-Sig (the governing body of PCI Express) for vendors who wish to have their products listed on the PCI-Sig’s PCI Express Integrators List for PCI Express 2.0. In addition, significant changes in both the physical layer electrical measurements as well as link and transaction layer compliance tests will be instituted.
Date: August 29, 2007 (available on demand until August 28, 2008)
Time: 2:00 PM ET / 11:00 AM PT
Sponsored by: Agilent Technologies in partnership with Test & Measurement World and EDN
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Designing good switching modules for ATE systems
This tutorial will provide attendees with an understanding of switching systems and the elements in them. It will also describe the discontinuities associated with putting switches in a signal-transmission path.
Date: August 15, 2007 (available on demand until August 14, 2008)
Time: 12:00 PM ET / 9:00 AM PT
Sponsored by: Giga-tronics in partnership with Test & Measurement World
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Date: May 23, 2007 (available on demand until May 22, 2008)
Sponsored by: ASSET InterTech in partnership with Test & Measurement World
Register for this Webcast View reference links and recommended readings related to how to maximize your test coverage here
