T&MW Awards Programs
Recognizing the Best in Test Products and Test Professionals
- Best in Test Product Awards
- Test Product of the Year Award
- Test of Time Award
- Test Engineer of the Year Award
Best in Test Product Awards
The Best in Test awards are presented annually by the editors of Test & Measurement World. These awards honor important and innovative new products and services in the electronics test and measurement industry. Products from all areas of electronics testing and inspection are eligible. Test & Measurement World has been presenting the Best in Test awards since 1991.
Test & Measurement World announced the finalists for the 2009 Best in Test awards, in our December 2008/January 2009 issue. Readers were asked to vote for their favorite in each of 15 categories. The category winners were announced in our April issue. The overall top vote getter was declared the 2009 Test Product of the Year (see below).
We will begin accepting nominations for the 2010 awards in September 2009.
See also:
2008 Best in Test awards
2007 Best in Test awards
2006 Best in Test awards
2005 Best in Test awards
2005 awards celebration
Archive of past winners of Best in Test awards
Test Product of the Year Award
Each year, when we announce the winners of the Best in Test awards, we invite our readers to choose from among the products and vote for the Test Product of the Year. This year, the winner of the Test Product of the Year award will be the Best in Test finalist that receives the most votes. We will announce the winner here on April 1 and in our April issue.
We announced the winner of the 2009 Test Product of the Year award on April 1, 2009. The winner is the Wi-Fi Data Acquisition Device from National Instruments.
See also:
2008 Test Product of the Year
2007 Test Product of the Year
2006 Test Product of the Year
2006 awards celebration
2005 Test Product of the Year
2005 awards celebration
Test of Time Award
While Best in Test awards honor new products, the Test of Time award recognizes a product that continues to provide state-of-the-art performance at least five years after its introduction.
Test & Measurement World announced the six finalists for the 2009 Test of Time award in our December 2008/January 2009 issue and asked readers to vote for the winner. The recipient of the 2009 Test of Time award is the TestKompress ATPG tool from Mentor Graphics.
We will begin accepting nominations for the 2010 awards in September 2009.
See also:
2008 Test of Time award
2007 Test of Time Award
2006 Test of Time Award
2005 Test of Time Award
2005 Awards Celebration
Test Engineer of the Year Award
Test & Measurement World acknowledges the special contributions that engineering test makes with our annual Test Engineer of the Year award. Sponsored by National Instruments, the award carries with it an educational grant presented to an engineering school designated by the winner.
Each year, we invite the test community to nominate engineers for this prestigious award. From the recommendations we receive, we select six finalists and publish profiles of them in an issue of our magazine. From among those six, readers vote for the Test Engineer of the Year.
The finalists for the 2009 Test Engineer of the Year award were announced in our October 2008 issue. On April 1, 2009, we announced that Eddie Abshire of St. Jude Medical Neuromodulation Division had been voted as the winner of the 2009 Test Engineer of the Year award.
Learn how to recommend a candidate for a future year.
See also:
2008 Test Engineer of the Year, Hung Nguyen
2007 Test Engineer of the Year, John Gmitter
2006 Test Engineer of the Year, Zafer Boz
2005 Test Engineer of the Year, Anthony Levandowski
2004 Test Engineer of the Year, Chris Grachanan