Best in Test: Archive of Past Winners

1997 Honorable Mentions
DL2700 Digital Storage Oscilloscope, Yokogawa Corp. of America
Model 160 Series Handheld Counters, Fluke
Model 1560 'Black Stack' Thermometer, Hart Scientific
GageLab Instrument Platform, Gage Applied Sciences
Matrox Genesis Real Time PCI Image Processor, Matrox Electronic Systems
Model 1269 VXI/VME Chassis, Racal Instruments
BLU300 Loader/Unloader System, Schlumberger
Pyramid Probe, Cascade Microtech
Serial Infrared (SIR) Tester, Genoa Technology

1996 Best in Test Winners
Sherlock, Sunrise Test Systems
Horizon 1500 harness tester, Cabletest International
Model 2000 digital multimeter, Keithley Instruments
PXL37 digital camera system, Photometrics
TekRanger TFS3031 mini-OTDR, Tektronix
Model 867 graphical multimeter, Fluke Corporation
9370 series digital oscilloscopes, LeCroy Corp.
EFA-1 & EFA-2 electromagnetic field analyzers, Wandel & Goltermann
CMD80 digital radio communications test set, Rohde & Schwarz/Tektronix
VM9000 VXI Modular Instrumentation Platform, VXI Technology
TekScope THS 720, Tektronix (Test Product of the Year)

1996 Honorable Mentions
J995 Memory Test System, Teradyne
DSP-EZ Programming Platform, Data Translation
Visual Test Extentions (VTX), Keithley MetraByte
System Two Audio Test System, Audio Precision
MXI-2 VXI Controllers, National Instruments
E2910A PCI Bus Exerciser, Hewlett-Packard
Scan EM-E and Scan EM-H EMI Proves, Credence Technologies
WT-110 Digital Power Analyzer, Yokogawa Corp. of America
HSP 4420 High-Speed Flying Prober, Integrated Solutions
Site Master 330 Cable and Antenna Analyzer, Wiltron
Model 400 of the Vega Series VLSI Testers, Megatest Corp.
Junction Xpress Vectorless Opens Test Tool, Genrad
Super Z Teradyne ATE Enhancement, Softlink
GT50-DIO Dynamic Digital I/O Card, Geotest
8801T Test Handler, Aetrium
PGA and BGA Contactors, Synergetix

1995 Best in Test Winners
DieMate, Texas Instruments & MicroModule Systems
Model 5300, North Atlantic Instruments
TDS 700A DSO, Tektronix
pQT ESD Generator, PicoQ Corp.
ChamberView, Cintek Automation Systems
CurrentSyntesis, CrossCheck Technology
FaxLab, Genoa Technology
OMS-200, Wandel & Goltermann
DASM-VIP, Analogic Corp.
HP 54620A, Hewlett-Packard (Test Product of the Year)
Scan ABT Test Access Logic, National Semiconductor

1995 Honorable Mentions
AT-MIO-16E-2, AT-MIO-16XE-50 Data Acquisition Boards, National Instruments
PCI-311, PCI-312 Plug-in Arbitrary Waveform Generator Cards, PC Instruments
Pay-Per-Use Option for HP 3070 Board Testers, Hewlett-Packard
LATEST, IBM
Virtual Test, Cadence
ASICTEST, Logic Vision
Testability Analyzer, Giordano Automation
BLU Board Loader/Unloader, Schlumberger
BoardRunner, AccuMate
LW420 Arbitrary Waveform Generator, LeCroy Corp.
AWG2005 Arbitrary Waveform Generator, Tektronix
VX1410 Chassis, Tektronix
1/2-Size Short Contact Test Sockets, Johnstech International
Multiscan/1200, IOtech
ABES Memkory Burn-in System, Micro Control Co.

1994 Best in Test Winners
VC-5430 Digital Oscilloscope, Hitachi DenshiAmerica
GTXI PC Instrument System Chassis, Geotest
PCMCIA-GPIB Interface Card, National Instruments
Safecracker Algorithmic Vector Generator, Teradyne
MCT 1149 VLSI/DFT Test System, Micro Component Technology
Mercury Environmental Test System, EJ Systems
Test Assistant, Compass Design Automation
9000 Multifunction Calibrator, Wavetek
TestJet, Hewlett-Packard (Test Product of the Year)
EMCO 3143 BiConiLog Antenna, Electro-Mechanics Company
TLS 216 Logic Scope, Tektronix
FIS-100 Flat Panel Inspection System, Photon Dynamics
Scopestation 140, LeCroy

1994 Honorable Mentions
J921 VLSI Test System, Teradyne
IDS P2X ProbePoint Extension, Schlumberger
Delta 100 VLSI Test System, LTX
AIDA II Design-for-Test Software, CrossCheck Technology
HP 75000 ATM Tester, Hewlett-Packard
Fluke 670 LANMeter, Fluke
ISR FFT Tools, Integrated Scientific Resources
Magnetic Force Microscope, Digital Instruments
3054 DSP Spectrum Analyzer, Tektronix
494 Solar-Charged DMM, Simpson Electric
IPA 310 Interconnect Parameter Analyzer, Tektronix
TCP-5 Thermocouple Test Probe, Everett Charles Technologies

1993 Best in Test Winners
HP 89410A/89440A Vector Signal Analyzers, Hewlett-Packard
Multimode Scanning Probe Microscope, Digital Instruments
Model 295 Arbitrary Waveform Generator, Wavetek Corp.
MegaLab/MegaLink, Knights Technology
MCT 6100 IC Test Handler, Micro Component Technology
GageScope Software, Gage Applied Sciences
LabView for Windows, National Instruments (Test Product of the Year)
VXI600 Programmable Power Suppy, Advanced Power Designs
ECAT Pulsed EMI Test System, Keytek Instrument Corp.
Dantes, Cadence Design Systems
BoardWatch 9000, Teradyne
FastScan/FlexTest, Mentor Graphics

1993 Honorable Mentions
HP Test Book, Hewlett-Packard
LogicMaster ATS4 IC Tester, Integrated Measurement Systems
Model DI-200 Data Acquisition Card, Dataq Instruments
CIR-1000 Screening System, Celect
Model 3001 GPX Logic Analyzer, Tektronix
Model E1350 Silicon Debug System, Advantest America
DCT-S Telecom Test System, ISDN Technologies Corp.
DaqBook/100 Data Acquisition System, IOtech
Model 2414A Arbitrary Wavefrom Generator, Pragmatic Instruments
ABES-III Automatic Burn-in & Environmental System, Micro Control Co.
J990 Series Memory Test Systems, Teradyne
SS30 Spring Contact Probe & Receptacle, Interconnect Devices
AFHT II-RT Automatic Dynamic Flying Height Tester, Pacific Precision Laboratories
Model 2784 Microwave Spectrum Analyzer, Tektronix
TDS 640 Oscilloscope, Tektronix

1992 Best in Test Winners
GR9000 Telecommunications Test and Measurement System, GenRad
CXI-3300 Inline Process Monitor, IRT Corp.
Model 2001 High-Performance DMM, Keithley Instruments
90 Series ScopeMeters, John Fluke Mfg. Co. Inc. (Test Product of the Year)
HF Video Microscope System, Optem International, a Divison of Amarel Precison Instruments
IDS 7000 FIBstation, Schlumberger Technologies, ATE Division
Sigma 2000 Scanning Electron Microscope, Amray Inc.
HP 71500A Microwave Transition Analyzer, Hewlett-Packard, Signal Analysis Division
Type 3538 Modular Test System, Bruel & Kjaer Test Systems
Hypersignal-Windows AMPS Version 1.10, Hyperception Inc.
Performance Enhancement Peripherals, GlobeTech International Inc.
Victory 2.0 Boundary Scan Software, Teradyne

1992 Honorable Mentions
Dummy Components, TopLine Components
VXIcpu-030 Embedded Computer, National Instruments
HP 8146A OTDR, Hewlett-Packard
9134L Long Memory Digital Storage Oscilloscope, LeCroy
Scan Educator, Texas Instruments
PRS-1000 Photoreflectance Spectrometer, Olympus Corp.
MicroZoom Probe Automated Microscope, Leica Inc.
DT3831 Series Anti-Aliasing Data Acquisition Boards, Data Translation Inc.
PR-650 SpectraColorimeter, Photo Research
M100 OptiTest Local Loss Test Set, Siecor Corp.
3504/3525 Backplane Tester, WEE Gmbh
Model 5000ds Double Sided Tester, Integri-Test Corp.
5790A Automated AC Measurement Standard, John Fluke Mfg. Co. Inc
Model 4065 Digital Cesium Frequency and Time Standard, Frequency & Time Systems
PM 6680 Timer/Counter, John Fluke Mfg. Co. Inc
LabWindows for DOS, Version 2.0, National Instruments
TDS 540 Digitalizing Oscilloscope, Tektronix
ATEasy Software, Geotest
Variables Value Monitor, Biomation

1991 Decade of Progress Winners
We began our awards program in 1991--our 10th anniversary. To commemorate our anniversary, we awarded the Decade of Progress Awards to 10 products that our editors felt had made significant advances in test technology during the previous decade.

The products selected were not necessarily the most successful of their type, either commercially or technically. They were, however, the first examples of technologies that changed test forever. In order to qualify for Decade of Progress consideration, the technical advance had to be significant enough to change the methods employed by test engineers in that particular part of the industry. Furthermore, the technology (though not necessarily the product) had to be successful enough to have attracted imitators.

First IBM PC-Based Instrument Board (1981), Techmar (now Scientific Solutions): Lab Master (Test Product of the Decade)
First PC-Instrument Control Software Package (1984), Adaptable Laboratory Software (became Keithley ASYST): ASYST
First X-Ray Microscope with a Microfocus Source (1982), Nicolet: Microx 2
First ICs Made for Board Testability (1985), Logical Solutions: LT74TC32/LT74TV32 Testability Circuits
First Combinational Board Tester (1981), Teradyne: L200
First CAD-Based E-Beam VLSI Diagnostic Workstation (1987), Schlumberger: IDS 5000
First Mixed-Signal Component Tester (1982), LTX: LTX77 with DX90 option
First Arbitrary Waveform Generator (1985), Data Precision (now Analogic): 2020 Waveform Synthesizer
First Tester-in-a-Head Device-Tester Architecture (1982), Micro-Component Technology: 2000 Series
First Direct EDA/ATE Software Link (1986), TSSI: TDS

1991 Honorable Mentions
MXI and MXI-based products (1989), National Instruments
Model 4094 Digital Oscilloscope (1982), Nicolet Test Instruments
ExperTest 2000 (1987), Array Analysis
CAF (Computer Automated Fixturing) (1986), In-Circuit Test
Video Measurement System/Vidicom Qualifier 863 (1981), Optical Gaging Products Inc.
TC01 Temperature Controller (1981), Sun Electronic Systems Inc.
Accelerator Liquid Burn-in System (1984), FTS Systems Inc.
HF-65 Microscope (1986), OPTEM International
Twister/HEP-25 (1989), Everett/Charles Contact Products Inc.
Coaxial Probe (1991), Interconnect Devices Inc.
5371A Modulation Domain Analyzers (1987), Hewlett-Packard, Santa Clara Division
HP Basic Products (1981), Hewlett-Packard
HP4145 Semiconductor Parameter Analyzer (1982), Hewlett-Packard, Japan
FiberScout (1991), Tektronix
3D SEM (1989), Leica
3DX Series 3000 (1991), Four Pi Systems
Data 6000 Waveform Analyzer (1982), Analogic Corporation (Data Precision)
HP8780A/HP8980A Vector Signal Generator/Modulation Analyzer (1987), Hewlett-Packard

Back to Main Best in Test Page