T&MW's Top Articles for May 2008
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How does a Smith chart work?
The Smith chart appeared in 1939 as a graph-based method of simplifying the complex math (that is, calculations involving variables of the form x + jy) needed to describe the characteristics of microwave components. Read More
Testing toward secure networks
When you make an online transaction or use a bank's teller machine, you trust that the financial institution's networks will protect your valuable information. Data centers of major financial institutions and other businesses use security platforms from Crossbeam Systems to protect their networks and your data. Read More
Test, inspection technologies target PCB quality
Agilent Technologies' new Medalist sj5000 AOI platform and CheckSum's MultiWriter pps onboard gang programming system are just a few of the product announcements from the APEX 2008 show floor. Read More
Genetic algorithm solves thermistor problem
In an article posted on EDN.com, a strategic applications engineer at Maxim Integrated Products presented what he considers a quicker alternative than the standard numerous equations for finding an optimal solution to a multivariable problem. Read More
Enabling seamless WiMAX fabric
Chipsets are emerging that add WiMAX capability to mobile PC and cellphone applications, while lab and production test equipment evolves to keep pace. Read More
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100-Gbps Ethernet: In demand now
John D'Ambrosia of Force10 Networks is chair of the IEEE P802.3ba Task Force, whose job is to develop a standard for 40-Gbps and 100-Gbps communications links. Martin Rowe spoke to D'Ambrosia about the project and the growing demand for more bandwidth. Read More
Guest Commentary: GPIB remains in heavy use
Despite the emergence of new instrument-control bus technologies, GPIB remains the foundation for instrument-control systems. "It just works," is the top response from engineers when asked why they use GPIB for instrument control. Read More
Embedded software applications challenge test limits
Technical evangelist Bill St. Clair discusses the development of embedded software for avionics and automotive applications. Read More
Guest Commentary: Should you migrate test applications to Windows Vista?
A new security structure, virtualization, and a 64-bit version will raise compatibility issues should you migrate your test application. Read More
Top Blogs
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Stupid consumers plague CE industry
A new dot-4 product and a clarification
CE industry makes consumers stupid
Online technical calculator