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T&MW's Design, Test & Yield News

May 5, 2009

Going beyond design for test
In an exclusive interview, Joeseph Sawicki, VP and General Manager, Design-to-Silicon Division of Mentor Graphics, discusses the growing importance of time and frequency measurements in a variety of applications. Read More

A D V E R T I S E M E N T

2009 IEEE MTT-S International Microwave Symposium (IMS)
The premier microwave & RF conference and exhibition is coming to Boston. Wireless, Radar, RF, high frequency semiconductors, electromagnetics, com/mil RF, microwave and mm-wave electronics and applications.
Register by May 15 and Save 25%. June 7-12, 2009.

Ansoft tools couple with Ansys for real-world simulation
Ansys has announced a first milestone in coupling Ansys and Ansoft products, successfully performing multiphysics simulations that involve electromagnetic applications. Read More

Testing DigRF for 3G handsets
DigRF stands poised to replace the two main forms of data-communication paths between RF and baseband semiconductor devices: analog signaling and design-specific, proprietary digital signaling. With the DigRF standards, the MIPI Alliance is striving to replace the assortment of I/Q signaling interfaces with a common digital, packet-based serial interface. Read More

Reduce test costs with careful PXI design
As the economic downturn increases pressure on companies to reduce test costs, engineers may find that the configurable nature of PXI test systems offers a cost advantage over stand-alone instruments. Developers can trim costs further by fully assessing their test needs, carefully planning the system architecture, and selecting versatile, low-power components. Read More

Finally time to Twitter
Can traditional print newspapers and magazines—like Test & Measurement World and EDN—survive the challenges posed by blogs, Twitter, LinkedIn, and so on? I think the survival question is the wrong question to ask—the question that should be asked is: How can the different types of media complement each other? Read More

A D V E R T I S E M E N T

SEMICON Singapore May 20-22, 2009 Suntec, Singapore
SEMICON Singapore 2009 is your access to global industry suppliers, customers, and current information. Attend the exhibition and FREE technical and business programs from semiconductor manufacturing to PV technology. See the Infinite Possibilities.

Being fashionably innovative
Last Friday I got another reminder of the link between weak economies and innovation at my son's graduation ceremony. The reminder came from commencement speaker Kenneth Cole, a designer of shoes, clothing, and accessories, who got his start—believe it or not—during a recession. Read More

Swine Flu: Hogwash or serious threat to electronics business?
What's more contagious: H1N1 Flu, more commonly known as Swine Flu, or fear of H1N1 Flu? I'm not a doctor, but I'm going to guess it's the fear. Read More

Integrated flow speeds power-amplifier-module design
Agilent Technologies has announced an expansion of the use of its Advanced Design System (ADS) EDA software at Skyworks Solutions, a provider of high-performance analog and mixed-signal semiconductors. Read More

Goepel teams with Testonica to extend JTAG/boundary scan
Goepel electronic, a worldwide vendor of JTAG/boundary-scan products compliant with IEEE 1149.x standards, announced that Testonica Lab has joined its global alliance program GATE (Goepel Associated Technical Experts). Read More

What do you know about function and arbitrary waveform generators?
Answer our May Instrumentation Challenge question correctly, and you could be eligible to win a prize.

Question: Which statement does not describe the advantages of a DDS (direct digital synthesis) architecture in function and arbitrary generators?
Prize: $300 Best Buy gift card
Sponsor: B&K Precision

Go to the main challenge page

T&MW's May issue is online
Our May cover story describes an RF-based locator system that may someday help fire departments pinpoint firefighters in trouble. The Test Ideas article details a programmable amplifier that lets you find an unknown resistance for measuring temperature or strain. The issue also includes the PXI Test Report. Read it today

Industry calendar of events
Upcoming events include Semicon West and the Design Automation Conference, both scheduled for July. For more information about these and other test-related events, visit our online calendar.

 

A D V E R T I S E M E N T

Need help with your Machine Vision application? Check out DALSA’s Machine-Vision Technology Center in the in the TMWorld.com Resource Center.
…featuring white papers on everything from Electronic Shuttering to Digital Image Capture



S P O N S O R E D


Other Resource Center Features:
Medalist i3070 In Circuit Test
Case Study by Agilent


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