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 June 25, 2009
Arts and crafts for test
 Living in an area that isn't exactly a hotbed of electronics technology, I found a variety of materials that might prove useful in the test lab or prototyping shop at arts and crafts stores. Read More
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A D V E R T I S E M E N T
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DisplayPort bus demands different tests
DisplayPort, the serial bus that sends digital video to TVs and monitors, needs testing like any other high-speed bus. But its architecture differs from other buses that use bidirectional links, and you can't run loopback tests. Read More
Networks work in distributed systems
When you need to keep analog measurement wires short, yet your PC is located farther away from your measurement instrument than either USB or GPIB can reach, Ethernet may just fill the bill. Read More
Wireless and energy take the lead
Last year, "wireless sensor networks" was the hot phrase at Sensors Expo. This year, "energy harvesting" has joined the fray. Read More
Design and test highlights at the microwave show
 T&MW attended the International Microwave Symposium earlier this month. Here is a summary of test-related products demonstrated there. Read More
Geotest teams up with JTAG Technologies on functional, structural test
Geotest-Marvin Test Systems and JTAG Technologies have announced a new technology partnership under which Geotest offers preconfigured PXI test systems including the JTAG Technologies' JT 37x7/PXI boundary-scan controller. Read More
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A D V E R T I S E M E N T
100000000 measured values per sec. Can you believe it?
Genesis HighSpeed products (previously sold under the Nicolet brand) feature high sample rates with mid-to-high channel counts and are perfect for your instrumentation needs. All are based on modular platforms and can be configured to your application-be it a single channel or a thousand
Sample rates range from 100 kS/s to 100 MS/s per channel.
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Generate, capture, and analyze digital I/O signals
To generate or capture parallel digital data from electronic devices such as analog-to-digital and digital-to-analog converters, you can use the NI PXIe-6545 or NI PXIe-6544 PXI Express (PXIe) cards. Read More
Audio analyzer adds logic display
The APx585 audio analyzer from Audio Precision APxV2.4 software adds two new metadata monitors for HDMI audio. Read More
T&MW's Top Articles of May 2009
"Finding firefighters through heavy smoke," from our May issue was among the highest viewed print articles on our Web site in May, and "Agilent demonstrates USB 3.0 tests with the NEC Electronics' USB 3.0 host controller" was among the highest viewed Web-exclusive articles. Editor-in-Chief Rick Nelson's "LEDs get respect at Lightfair" was one of the most popular blog entries of the month. Read More
What do you know about semiconductor processes?
 Answer our June challenge question correctly, and you could be eligible to win a $300 gift card.
Question: Which statement best describes the fault spectrum of state-of-the-art semiconductor processes?
Prize: $300 American Express gift card
Sponsor: Test & Measurement World
Go to the main challenge page
Engineers tackle jitter
For "The philosophy of jitter," our June cover story, we visited Altera to learn how the company's engineers perfected the 40-nm Stratix IV FPGA. Another feature in our June issue explains how STMicroelectronics is using a small-delay-defect ATPG methodology to achieve even higher coverage than is possible with transition-delay ATPG. Plus, the Q&A column in the Machine-Vision & Inspection Test Report discusses the speed limitations that the original FireWire bus driver places on 1394b-equipped cameras. Read More
Industry calendar of events
Upcoming events include EMC Symposium (August), NIWeek (August), and Autotestcon (September). For more information about these and other test-related events, visit our online calendar.
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