|
 June 24, 2009
Machine vision aids solar-cell inspection
As manufacturers of solar cells face pressure to drive down costs, they are turning to higher-volume automated manufacturing, accompanied by high-speed inspection to increase yields and improve the accuracy of their products. Read More
Windows-compliant driver speeds 1394 cameras
Although the standard Windows FireWire bus driver works well with devices such as cameras and hard drives equipped with the IEEE 1394a interface, the driver has not been updated to take advantage of newer functions introduced with IEEE 1394b. Read More
AOI and AXI business contracts, machines improve
Agilent Technologies may have exited the automated optical and x-ray inspection businesses, but other vendors say their businesses are healthy, and they are committed to their product roadmaps. Read More
Dalsa launches entry-level Camera Link frame grabber
Part of the Xcelera series of frame grabbers from Dalsa, the Xcelera-CL LX1 Base is an image-acquisition board intended for use with Camera Link Base cameras. Read More
Cognex software eases integration of vision systems
Cognex Connect is a suite of communications capabilities that enables out-of-the-box connectivity between Cognex In-Sight vision systems and virtually any major PLC, robot, HMI, and fieldbus system commonly used in factory automation. Read More
JAI announces low-noise, high-sensitivity CCD cameras
JAI has added four new members to the Compact tier of its C3 camera series, each with a 2/3-in. progressive-scan CCD capable of producing a resolution of 1.4 megapixels. Read More
Microscan miniature imager reads direct part marks
The MINI Hawk from Microscan packs DPM reading algorithms into a miniature imager for use in barcode and 2-D track, trace, and control applications. Read More
MIS unveils 32-Mpixel digital microscope camera
Benefits of the new PAXcamARC+ include high-dynamic-range image processing, a feature that blends multiple exposure levels to provide expanded detail in light and dark areas of an image. Read More
Vision Components' software enables camera-guided wafer positioning
A software library for Vision Components' Smart Camera family allows camera-supported production monitoring and quality control in silicon-wafer production. Read More
What do you know about semiconductor processes?
 Answer our June challenge question correctly, and you could be eligible to win a $300 gift card.
Question: Which statement best describes the fault spectrum of state-of-the-art semiconductor processes?
Prize: $300 American Express gift card
Sponsor: Test & Measurement World
Go to the main challenge page
Small-delay-defect testing; the philosophy of jitter; test supplies at the craft store?
One feature in our June issue explains how STMicroelectronics is using a small-delay-defect ATPG methodology to achieve even higher coverage than is possible with transition-delay ATPG. For "The philosophy of jitter," our June cover story, we visited Altera to learn how the company's engineers perfected the 40-nm Stratix IV FPGA. And in his "Test Voices" column, Brad Thompson explains how he found useful test components by rummaging around his local crafts store. Read More
Industry calendar of events
Upcoming events include Semicon West and the Design Automation Conference, both scheduled for July. For more information about these and other test-related events, visit our online calendar.
|
