Technical Articles

• 09.27.2012
• type: Test How-To
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Today’s broad mix of delivery and viewing technologies now require automated methods of testing. Read More...

• 09.13.2012
• type: Test How-To
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Developed to describe the microwave properties of interconnects, S-parameter formalism offers a natural way of describing crosstalk. Read More...

• 10.01.2010
• type: Test How-To
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USB data-acquisition modules are great for data acquisition, but they often need additional protection circuits when used in production test. Read More...

• 08.15.2012
• type: Test How-To
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If a USB instrument looked like a disc drive, then you could retrieve data faster and more easily than polling the instrument for data. Read More...

• 02.01.2009
• type: Test How-To
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DeWalt engineers design and test electronics and batteries that control motors and manage power. Read More...

• 05.14.2013
• type: Test How-To
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Commercial ICs and semiconductors now require more stringent testing at wider operating temperature ranges, so what's the best way forward? Read More...

• 05.03.2013
• type: Test How-To
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Combining multiple attenuator modules in a PXI chassis can create a MIMO test development system for 802.11ac, LTE advanced, multi-channel signal analysis, EW signal capture and analysis or wideband digital pre-distortion. Read More...

• 04.23.2013
• type: Test How-To
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Although baseband digital, RF, and analog signals are interdependent, their relationships can often be elusive based on traditional debug methods. Read More...

• 04.16.2013
• type: Test How-To
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The one piece of gear that’s essential for EMC troubleshooting is a spectrum analyzer. You can buy a decent portable for about $10k or used ones go for $1k to $5k if you don’t mind the 30 to 80 pounds of weight or the initial investment. This article reviews several models that cost under $2,000. Read More...

• 04.09.2013
• type: Test How-To
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Words don’t always come out of an ADC the right way, so what's the best way to detect and count bit errors ? Read More...