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Technical Articles
Make sense of a linear power supply’s data sheet
- 01.08.2013
- type: Test How-To
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Choosing the most appropriate power supply for a specific application requires understanding what those specs convey or (sometimes) what they may be intended to de-emphasize. Read More...
Reduce power consumption in portable test instruments
- 10.01.2012
- type: Test How-To
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Lower-power components reduce overall power consumption in portable instruments and in line-powered instruments as well. Read More...
Complex modulation comes to optical fiber
- 03.01.2010
- type: Test How-To
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Fiber is running out of bandwidth just as dial-up lines did years ago. Complex modulation solves the problem, again. Read More...
Test Ideas: Find vibrations in defective rotating parts
- 07.01.2010
- type: Test How-To
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Data-acquisition systems need signal conditioning to prevent unwanted signals from masking important data. Read More...
Test Ideas: Microcontroller runs relay endurance test
- 11.01.2010
- type: Test How-To
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An automated test setup ensures that relays and switches comply with safety standards. Read More...
Test Ideas: Condition thermocouples before digitizing
- 04.01.2011
- type: Test How-To
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Use a circuit to produce a voltage proportional to temperature. Read More...
Addressing Thermal Considerations in PXI/PXIe System Design
- 07.18.2012
- type: Test How-To
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Chassis design greatly affects cooling in a card chassis, and PXI-PXIe chassis must conform to PXI specifications for air exhaust. Read More...
Electronic test 1956-1987, a look back (Part 2)
- 05.20.2013
- type: Test How-To
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Now here's some old electronic test equipment! Anyone have these in your lab, basement, memories? Read More...
Electronic test 1988-2000, a look back (Part 1)
- 05.17.2013
- type: Test How-To
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Here's a look at some landmark electronic test equipment from the period 1988-2000. Do you remember/still use any of these? Read More...
Validate and analyze complex serial-bus-link models
- 05.15.2013
- type: Test How-To
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The goal is to measure the DUT and not the test equipment, fixtures, or cables that are used to acquire the signal. The act of removing the effects of any of these elements can result in a significant improvement in the margin of the device. Read More...







