Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe

Test & Measurement World - June 01, 2002

Features

DFT puzzle comes together
Design-for-test (DFT) tools are smoothing the way toward complex device designs that are readily testable on economical ATE systems. Vendors of DFT and built-in-self-test (BIST) tools have been polishing their offerings so they easily fit together in the design flow—from behavioral-level design descriptions to fabricated silicon.


Departments


Product Update




Advertisement



Advertisements






©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites