All Webcasts

The Race to Higher Data Rates: Is Carrier Aggregation the Key to Winning?

The International Telecommunications Union (ITU) IMT-Advanced standard includes aggressive goals for "true 4G" including data rates of up to 1 GB/s in the downlink. At the same time, operators are increasingly acquiring fragmented spectrum, and want to use these spectrum holdings in a coordinated fashion to service subscribers with higher bandwidths. Carrier Aggregation (CA) is the answer to both issues, making it possible to meet and achieve the IMT-A goals with spectrum that may be scattered among two or more bands, and parallels the path of HSPA which started with Dual Carrier HSDPA in Rel. 8.

This presentation will explore CA, taking into consideration benefits to both carriers and subscribers, and will include concepts and deployment scenarios including potential issues, and protocol considerations. Deployment and subscriber availability timelines will be hypothesized based on anticipated supply chain timelines, with focus on test availability for this new technology.

LXI Today and Tomorrow: Evolution, Certification and Choice

Find out what is happening in LXI, the Test and Measurement standard for Ethernet control, and how the vendors are ensuring products conform to the standard. Discover how LXI is setting its evolutionary path of following the migration of Ethernet and IVI standards.  more >>

Oscilloscopes - It's Not Just Bandwidth

Engineers don't necessarily need the ultimate in bandwidth. For many applications, scopes having bandwidths in the low-gigahertz range perform fine, but what readers really require are easy-to-use instruments that get results fast.  more >>

Understanding the 3GPP Transmit Test Specification for LTE Base Stations

Base Stations must adhere to LTE specification performance parameters in order to ensure quality of service and minimize interference with other systems operating on adjacent bands. Technical specification TS 36.141 by the 3rd Generation Partnership Project (3GPP) provides the requirements and test methods for ensuring Base Station performance. This presentation focuses on transmitter characteristics testing and shows how, with a high quality signal analyzer, these required tests can be performed quickly and cost effectively.  more >>

High-speed in-system programming for Flash and serial EEPROM

If you are designing PCBAs which contain Flash and/or serial EEPROM devices,are responsible for the manufacturing or test of such boards, or are interested in the cost benefits of programming such devices in-situ, you owe it to yourself and your company to attend this webcast.Join us to learn about advanced in-system programming methodologies that save time and money.  more >>

Instruments Playing Well Together

As modular instruments become the preferred choice for automated test systems, where should readers begin as they integrate multiple platforms (PXI, VXI, AXIe) with traditional box instruments (LXI) into hybrid test systems? Test & Measurement World Contributing Editor Alan Earls hosts a webinar panel discussion featuring senior industry experts. Join us, register today!  more >>

Introducing the next generation of test automation & interoperability - the NTAF Specification

As networks become more complex, testing of network equipment requires multiple tools. Automation is frequently employed as a strategy to orchestrate the diverse test environment, but to date there have been no standards for tools to work together in a coordinated solution. The Network Test Automation Forum addresses this precise need by defining a specification for how test tools communicate. This webinar introduces NTAF, explains the newly ratified specification, and walks through a use case.  more >>

New T&MW Editorial Webcast: Power-Supply Measurements

Switching power supplies are found in nearly every electronic product. Power efficiency is gaining in importance as society stresses "going green." While highly efficient, switching power supplies can interfere with system operation because switching signals can generate unwanted noise and EMI. The unwanted signal can affect the quality of serial data streams as well. Engineers need to measure both efficiency and noise in switching power supplies.Test & Measurement World Contributing Editor Alan Earls hosts a webinar panel discussion featuring senior industry experts. Join us, register today!  more >>

New T&MW Editorial Webcast: Simulation and Hardware-in-the-Loop Test - Is it Really Test?

Hardware-in-the-loop (HIL) simulation has become increasingly important in the development and test of complex real-time embedded systems. It is attractive because it adds the complexity of the plant under control to the test platform and that complexity is then included in test and development by adding representations of all related systems. In this Webcast, panelists will address how HIL works and compares with other kinds of testing, when and where it is most useful and appropriate, how it works in practice, and what skills are required to implement HIL. Test & Measurement World Contributing Editor Alan Earls hosts a webinar panel discussion featuring senior industry experts. Join us, register today!  more >>

From Test Data to Business Intelligence

Identify the challenges of gathering, monitoring and understanding component and PCB supplier data, manufacturing test data, and CM process information.  more >>