All Webcasts
Back to the Basics of Electrical Power Measurement
June 13, 2012 2:00pm EDT
Many people's job function now requires them to make Electrical Power Measurements on the products their company produce and sell. However the Engineers or Technicians that need to make these Power Measurements may not be experts in the field or may need a refresher course. This Webinar will provide the attendees with Solutions and Education for making Electrical Power Measurements. Topics include DC and AC Power Measurements, Single Phase and Three Phase, 2 & 3 Wattmeter method, Power Factor measurements and some practical applications. We will cover the use of a Precision Power Analyzer and the Do's and Don'ts of using a Digital Oscilloscope for making these measurements. more >>
Posted: May 16, 2012 | Permalink
802.11 WLAN MIMO Test & Design Challenges
June 12, 2012 12:00pm EDT
The practical constraints of testing Radio Frequency Integrated Circuit (RFIC) devices in a Multiple-Input Multiple-Output (MIMO) topology. Techniques to optimize test equipment setup and operation for MIMO architectures are detailed. Because RFICs are tested at a device level, we'll discuss MIMO compliance testing and characterization within a cabled RF environment without open-air antennas. The IEEE 802.11 WLAN protocol is used as an example to detail the theory, specific use cases, and test scenarios. more >>
Posted: May 24, 2012 | Permalink
The Race to Higher Data Rates: Is Carrier Aggregation the Key to Winning?
December 14, 2011 1:00pm EST
The International Telecommunications Union (ITU) IMT-Advanced standard includes aggressive goals for "true 4G" including data rates of up to 1 GB/s in the downlink. At the same time, operators are increasingly acquiring fragmented spectrum, and want to use these spectrum holdings in a coordinated fashion to service subscribers with higher bandwidths. Carrier Aggregation (CA) is the answer to both issues, making it possible to meet and achieve the IMT-A goals with spectrum that may be scattered among two or more bands, and parallels the path of HSPA which started with Dual Carrier HSDPA in Rel. 8.
This presentation will explore CA, taking into consideration benefits to both carriers and subscribers, and will include concepts and deployment scenarios including potential issues, and protocol considerations. Deployment and subscriber availability timelines will be hypothesized based on anticipated supply chain timelines, with focus on test availability for this new technology.
more >>Posted: Dec 20, 2011 | Permalink
LXI Today and Tomorrow: Evolution, Certification and Choice
October 25, 2011 11:00am EDT
Find out what is happening in LXI, the Test and Measurement standard for Ethernet control, and how the vendors are ensuring products conform to the standard. Discover how LXI is setting its evolutionary path of following the migration of Ethernet and IVI standards. more >>
Posted: Oct 11, 2011 | Permalink
Oscilloscopes - It's Not Just Bandwidth
September 30, 2011 1:00pm EDT
Engineers don't necessarily need the ultimate in bandwidth. For many applications, scopes having bandwidths in the low-gigahertz range perform fine, but what readers really require are easy-to-use instruments that get results fast. more >>
Posted: Oct 4, 2011 | Permalink
Understanding the 3GPP Transmit Test Specification for LTE Base Stations
September 30, 2011 12:09pm EDT
Base Stations must adhere to LTE specification performance parameters in order to ensure quality of service and minimize interference with other systems operating on adjacent bands. Technical specification TS 36.141 by the 3rd Generation Partnership Project (3GPP) provides the requirements and test methods for ensuring Base Station performance. This presentation focuses on transmitter characteristics testing and shows how, with a high quality signal analyzer, these required tests can be performed quickly and cost effectively. more >>
Posted: Dec 2, 2011 | Permalink
High-speed in-system programming for Flash and serial EEPROM
September 14, 2011 2:00pm EDT
If you are designing PCBAs which contain Flash and/or serial EEPROM devices,are responsible for the manufacturing or test of such boards, or are interested in the cost benefits of programming such devices in-situ, you owe it to yourself and your company to attend this webcast.Join us to learn about advanced in-system programming methodologies that save time and money. more >>
Posted: Aug 26, 2011 | Permalink
Instruments Playing Well Together
June 23, 2011 12:01pm EDT
As modular instruments become the preferred choice for automated test systems, where should readers begin as they integrate multiple platforms (PXI, VXI, AXIe) with traditional box instruments (LXI) into hybrid test systems? Test & Measurement World Contributing Editor Alan Earls hosts a webinar panel discussion featuring senior industry experts. Join us, register today! more >>
Posted: Jun 14, 2011 | Permalink
Introducing the next generation of test automation & interoperability - the NTAF Specification
June 22, 2011 2:00pm EDT
As networks become more complex, testing of network equipment requires multiple tools. Automation is frequently employed as a strategy to orchestrate the diverse test environment, but to date there have been no standards for tools to work together in a coordinated solution. The Network Test Automation Forum addresses this precise need by defining a specification for how test tools communicate. This webinar introduces NTAF, explains the newly ratified specification, and walks through a use case. more >>
Posted: Jun 14, 2011 | Permalink
New T&MW Editorial Webcast: Power-Supply Measurements
May 25, 2011 12:00pm EDT
Switching power supplies are found in nearly every electronic product. Power efficiency is gaining in importance as society stresses "going green." While highly efficient, switching power supplies can interfere with system operation because switching signals can generate unwanted noise and EMI. The unwanted signal can affect the quality of serial data streams as well. Engineers need to measure both efficiency and noise in switching power supplies.Test & Measurement World Contributing Editor Alan Earls hosts a webinar panel discussion featuring senior industry experts. Join us, register today! more >>
Posted: May 20, 2011 | Permalink


