Webcast: Signal Integrity Design Using Fast Channel Simulation and Eye Diagram Statistics

Date: July 29, 2009 
Time: 2:00 PM EDT
Duration: 60 minutes
Sponsored by: Agilent Technologies, EDN and Test & Measurement World
Presenter: Sanjeev Gupta, Signal Integrity Applications Expert, EEsof EDA Division Agilent Technologies 

Improvements to traditional SPICE-type simulation have increased signal integrity channel simulation speeds to thousands of bits per minute. An overnight run can create a million-bit eye diagram and the associated metrics and statistical figures of merit. But signal integrity engineers need to repeat this determination for thousand of points in the design space in order to select the optimum combination of, for example, pre-emphasis, channel characteristics, and equalizer. Therefore, optimization using eye diagram goals requires a channel simulation technique that is orders of magnitude faster than even the fastest SPICE. This webcast will demonstrate the "what if" design space exploration workflow that our new million-bit-per-minute channel simulator and eye diagram tool enables. Who should view this webcast: Signal integrity engineers for multigigabit links who are running into effects previously only seen in RF and microwave circuits.

Click to learn more and register for this free Webcast.

Posted Jun 24, 2009