Webcast: Fast S-parameter Measurement for Signal Integrity Engineers
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Date: November 3,
2010
Time: 1:00 PM ET
Sponsored by: LeCroy, Test & Measurement World, and EDN
Presenter: Michael Schnecker, Business Development Manager, LeCroy
Exclusive Webcast: The use of s-parameters to characterize connectors, cables, backplanes and devices has increased in recent years as the transfer speeds of serial data interfaces have increased. Traditionally, instruments such as vector network analyzers (VNA) have been used for such measurements but these instruments are expensive and extremely complex to use. Efforts to use time domain instruments such as TDR/TDT while simpler still do not completely address the complexity issue and suffer from limited dynamic range and bandwidth.
This Webinar introduces a new time domain method which combines the speed and low cost of TDR/TDT measurements with the range and accuracy of a VNA. The background theory of the instrument's operation will be presented as well as example measurements on typical hardware with comparisons to measurements made using a VNA.
Click to learn more and register for this free Webcast.
Time: 1:00 PM ET
Sponsored by: LeCroy, Test & Measurement World, and EDN
Presenter: Michael Schnecker, Business Development Manager, LeCroy
Exclusive Webcast: The use of s-parameters to characterize connectors, cables, backplanes and devices has increased in recent years as the transfer speeds of serial data interfaces have increased. Traditionally, instruments such as vector network analyzers (VNA) have been used for such measurements but these instruments are expensive and extremely complex to use. Efforts to use time domain instruments such as TDR/TDT while simpler still do not completely address the complexity issue and suffer from limited dynamic range and bandwidth.
This Webinar introduces a new time domain method which combines the speed and low cost of TDR/TDT measurements with the range and accuracy of a VNA. The background theory of the instrument's operation will be presented as well as example measurements on typical hardware with comparisons to measurements made using a VNA.
Click to learn more and register for this free Webcast.
Posted Oct 22, 2010
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