Webcast: Overview of the Latest Test Methodologies for High Speed Serial Designs

Date: Monday, March 17, 2008 (available on demand until March 16, 2009)
Time: 2 PM Eastern Time / 11 AM Pacific Time
Sponsors: Tektronix in partnership with Test & Measurement World and EDN

Increasing data rates on the next generation Serial Data standards are creating new measurement challenges for all layers of the protocol stack. Tektronix understands these challenges and has a variety of tools available to address even the most complex of test requirements. This toolset includes solutions for signal integrity and compliance testing, receiver testing, digital validation and debug, and serial data link and network analysis.

In this webcast we will touch on the most common as well the as the most challenging measurement tasks and how Tektronix solutions can help to better characterize and validate your high speed design. 

Click here to learn more and register for this free Webcast.